2015
DOI: 10.1016/j.tsf.2014.12.032
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Effect of post-sulfurization on the structural and optical properties of Cu 2 ZnSnS 4 thin films deposited by vacuum evaporation method

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Cited by 26 publications
(1 citation statement)
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“…This peak is assigned by (♦) in figure (1). This diffraction peak may be attributed to (Cu x S) phase as reported by previous studies [11][12][13]. The possible reason behind the appearance of this secondary phase is the high concentration of thiourea in the sprayed solution.…”
Section: Structural Analysissupporting
confidence: 66%
“…This peak is assigned by (♦) in figure (1). This diffraction peak may be attributed to (Cu x S) phase as reported by previous studies [11][12][13]. The possible reason behind the appearance of this secondary phase is the high concentration of thiourea in the sprayed solution.…”
Section: Structural Analysissupporting
confidence: 66%