2017
DOI: 10.1016/j.egypro.2017.09.411
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Effect of Phosphorus and Boron Diffusion Gettering on the Light Induced Degradation in Multicrystalline Silicon Wafers

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Cited by 6 publications
(2 citation statements)
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“…Gettering is especially widely used in Si-based solar cell production, for which low-cost solar-grade Si is increasingly used. [3][4][5][6][7][8][9][10] Such material contains various undesirable metal impurities (Au, Cu, Fe, Ni, etc.) and structural defects, such as grain boundaries, dislocations, second-phase precipitates, oxidation-induced stacking faults (OISF), etc.…”
Section: Introductionmentioning
confidence: 99%
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“…Gettering is especially widely used in Si-based solar cell production, for which low-cost solar-grade Si is increasingly used. [3][4][5][6][7][8][9][10] Such material contains various undesirable metal impurities (Au, Cu, Fe, Ni, etc.) and structural defects, such as grain boundaries, dislocations, second-phase precipitates, oxidation-induced stacking faults (OISF), etc.…”
Section: Introductionmentioning
confidence: 99%
“…Since solar cells are wholesubstrate devices, it is preferable to use external gettering. External gettering is carried out by various methods, including phosphorus or boron diffusion, [4,5] ion implantation, [6] deposition of thin films, [7,8] laser processing, [9] grooving, [10] and others.…”
Section: Introductionmentioning
confidence: 99%