2006
DOI: 10.1016/j.jcrysgro.2006.04.094
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Effect of organic dopants on ZTS single crystals

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Cited by 74 publications
(37 citation statements)
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References 21 publications
(21 reference statements)
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“…Figure 4 shows the DC recorded for (200) diffracting planes in symmetrical Bragg geometry by employing MCD as describe above for EBST specimen. As seen in the figure the curve is quite sharp with out any satellite peaks which may otherwise be observed either due to internal structural grain boundaries [8] or due to epitaxial layer formed on the surface of the crystal by organic dopants [9]. We measured intensity and glancing angle.…”
Section: Characterizationmentioning
confidence: 88%
“…Figure 4 shows the DC recorded for (200) diffracting planes in symmetrical Bragg geometry by employing MCD as describe above for EBST specimen. As seen in the figure the curve is quite sharp with out any satellite peaks which may otherwise be observed either due to internal structural grain boundaries [8] or due to epitaxial layer formed on the surface of the crystal by organic dopants [9]. We measured intensity and glancing angle.…”
Section: Characterizationmentioning
confidence: 88%
“…The hardness test was performed for the loads varying from 25g to 100g and the stability of the crystals towards the external stresses was observed.The dielectric constant of the material can be measured using two probe method. The samples were cut and polished, thenecessary sides were coated with graphite to obtain a good ohmic contact with the electrodes.Using different temperature ranging[40 0 C to 75 0 C ]the capacitance and dielectric loss values were carried out [11] using an Agilent 4284ALCR meter for frequencies like 1KHz,10KHz,100KHz,1MHz.The dimension of the growncrystals was measured using a microscope. Air capacitances were also measured for the dimensions equal to that ofall thecrystals.…”
Section: International Organization Of Scientific Researchmentioning
confidence: 99%
“…The incorporation of suitable additives in the solution lead to an increase in metastable zone width of the solution by their tendency of forming complexes and coordination bonds with metallic impurities present in the solution [4][5][6]. The EDTA and H 2 O 2 are the good surfactant additives, which form complexes with the metallic impurities in the solution and thereby increase the Ostwold-Mier's metastable zone with [7]. Thus the presence of EDTA and H 2 O 2 in the solution, prevent the incorporation of impurities into the growing crystal and rarely enter into the crystal lattice thereby confirm the growth of high quality crystals for device fabrication.…”
Section: Introductionmentioning
confidence: 99%