2010
DOI: 10.1088/0022-3727/43/28/285203
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Effect of nitrogen doping on TiOxNy thin film formation at reactive high-power pulsed magnetron sputtering

Abstract: To cite this version:Vitezslav Stranak, Marion Quaas, Robert Bogdanowicz, Hartmut Steffen, Harm Wulff, et al.. Effect of nitrogen doping on TiOxNy thin film formation at reactive high-power pulsed magnetron sputtering. Journal of Physics D: Applied Physics, IOP Publishing, 2010, 43 (28) AbstractThe paper is focused on a study of formation of TiO x N y thin films prepared by pulsed magnetron sputtering of metallic Ti target. Oxygen and nitrogen were delivered into the discharge in the form of reactive gases O … Show more

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Cited by 50 publications
(25 citation statements)
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References 72 publications
(100 reference statements)
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“…3(a) shows the typical XPS survey scan of the typical sample. The large amount of C element in the result was mainly attributed to carbon contamination during the transfer of the samples to the XPS device [22]. In addition, some residual carbon from organic precursors used in sol-gel method or carbon tape could have contributed to the C signal as detected by EDX.…”
Section: Xps Studymentioning
confidence: 97%
“…3(a) shows the typical XPS survey scan of the typical sample. The large amount of C element in the result was mainly attributed to carbon contamination during the transfer of the samples to the XPS device [22]. In addition, some residual carbon from organic precursors used in sol-gel method or carbon tape could have contributed to the C signal as detected by EDX.…”
Section: Xps Studymentioning
confidence: 97%
“…The binding energies and the splitting of 5.7 V of the first doublet matches with Ti 4+ (1/2) and (3/2) in TiO 2 . The second doublet is much more difficult to attribute since it can correspond to (i) Ti 3+ in bulk TiN, (ii) Ti 3+ associated to O vacancies in TiO 2 lattice, or (iii) Ti 2+ state for which TiO and TiN species contribute . However, the peak splitting of 6 eV and the position of the 2p 3/2 contribution are in favor of the presence of TiN .…”
Section: Resultsmentioning
confidence: 83%
“…The sharp XPS peaks for Ti, O, Fe, Na, and C were observed. The C element in the result was mainly attributed to carbon contamination during the transfer of the samples to the XPS device (Stranak et al 2010). The Na 1 s peak is due to the incomplete exchange of protons with Na + during acid washing with HCl (Pang and Abdullah 2012b).…”
Section: Xps Analysis For the Fe-tntsmentioning
confidence: 96%