2021
DOI: 10.3389/fmats.2021.645782
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Effect of Ni3Sn4 on the Thermo-Mechanical Fatigue Life of Solder Joints in 3D IC

Abstract: In this article, the 3D integration with Ni/Sn/Ni joints was conducted using transient liquid phase (TLP) bonding (250°C, 0.2 N) with different bonding time. After TLP bonding, plane-type Ni3Sn4 intermetallic compound (IMC) was observed, and when the bonding time is 180 min, complete Ni3Sn4 was found. The diffusion coefficient D was determined to be 32.4 μm2/min. Based on the finite element (FE) simulation, the results demonstrated that the shear stress and equivalent creep strain increased obviously with an i… Show more

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Cited by 6 publications
(3 citation statements)
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“…The essential intermetallic compounds (phase) of nickel tin (NiSn), iron tin (Fe 1.84 Sn), sulfur tin (SSn), chromium tin (Cr 2 Sn 3 ), chromium tin (CrSn 2 ), and tin phosphorus (SnP) were also present. Due to tin (Sn)-rich at the stainless steel (SS304) joint surface, the nickel-tin (NiÀ Sn) phase can be produced at the interface layer, especially in the boundary between the tin (Sn) and stainless steel SS304 during the bonding [42]. This is clearly indicated in the nickel-tin (NiÀ Sn) phase diagram.…”
Section: X-ray Diffraction (Xrd) Analysis At Intermetallic Layermentioning
confidence: 99%
“…The essential intermetallic compounds (phase) of nickel tin (NiSn), iron tin (Fe 1.84 Sn), sulfur tin (SSn), chromium tin (Cr 2 Sn 3 ), chromium tin (CrSn 2 ), and tin phosphorus (SnP) were also present. Due to tin (Sn)-rich at the stainless steel (SS304) joint surface, the nickel-tin (NiÀ Sn) phase can be produced at the interface layer, especially in the boundary between the tin (Sn) and stainless steel SS304 during the bonding [42]. This is clearly indicated in the nickel-tin (NiÀ Sn) phase diagram.…”
Section: X-ray Diffraction (Xrd) Analysis At Intermetallic Layermentioning
confidence: 99%
“…Solder joint is one of the major parts of electronic systems connecting various components to each other and delivering thermal, mechanical and electrical junctions [1][2][3]. However, the poor ductility and mechanical strength of solder joints sometimes put the reliability of electronic packages in harm's way, especially when they are exposed to the thermal cyclic loadings [4][5][6][7]. The main reason of failure in solder joints comes from the thermomechanical cyclic stresses caused by a variety of components with distinct coefficients of thermal expansion (CTE) [8,9].…”
Section: Introductionmentioning
confidence: 99%
“…As Moore’s Law continues to advance, integrated circuit chips are becoming smaller and more densely packed (Li et al , 2019), which also puts forward higher requirements for electronic packaging technology. On one hand, electronic packages need to adopt smaller and tighter packages to accommodate the size and density of chips (Khan et al , 2018; Zhang and Zhong, 2021). On the other hand, electronic packaging must also possess characteristics such as higher signal transmission speeds and improved heat dissipation efficiency to meet the requirements of integrated circuits.…”
Section: Introductionmentioning
confidence: 99%