Abstract:Micro-Raman spectroscopy and X-ray diffraction have been used to explore the lattice dynamics of Nb-substituted SrBi2(TaxNb1−x)2O9 (SBTN) thin crystalline films annealed at low temperature, 700oC. The relative intensity of the (115), (006) and (200) X-ray diffraction peaks, which correspond to the crystal structure and ferroelectric phase, nonmonotonically increases with the increase of Nb content. It turned out that SBTN films consist of fine-grained spherical structures if the percent of Ta ions substituted … Show more
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