2021
DOI: 10.1007/s42247-021-00190-w
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Effect of native defects on thermoelectric properties of copper iodide films

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Cited by 31 publications
(22 citation statements)
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“…In contrast to our findings, Murmu et al have reported a very large Seebeck coefficient, 561.8 μV/K at 300 K. 46 They attributed this large value to the energy filtering effect occurring due to the potential barrier, which is formed by neutral Cu atoms precipitated to the grain boundary region through iodine loss during annealing. This may be the reason for the rather low hole concentration, 1.6 × 10 19 cm −3 , and the low electrical conductivity, 1.18 × 10 3 S/m.…”
Section: ■ Results and Discussioncontrasting
confidence: 99%
“…In contrast to our findings, Murmu et al have reported a very large Seebeck coefficient, 561.8 μV/K at 300 K. 46 They attributed this large value to the energy filtering effect occurring due to the potential barrier, which is formed by neutral Cu atoms precipitated to the grain boundary region through iodine loss during annealing. This may be the reason for the rather low hole concentration, 1.6 × 10 19 cm −3 , and the low electrical conductivity, 1.18 × 10 3 S/m.…”
Section: ■ Results and Discussioncontrasting
confidence: 99%
“…Further, the vacuum-annealed CuI films presented the Hall mobilities of 6.1, 6.9, and 7.9 cm 2 /V·s and carrier concentrations of 5.6 × 10 19 , 4.3 × 10 19 , and 3.9 × 10 19 cm –3 annealed at temperatures of 100, 200, and 300 °C, respectively, exhibiting the increased Hall mobility and decreased carrier concentration. This is consistent with previous reports exhibiting the decreased hole concentration and increased Hall mobility of the CuI thin films with increasing vacuum annealing temperature, which can be attributed to the escape of iodine having a higher vapor pressure than copper from the film and decreased Cu vacancies, where the decrease in numbers of scattering centers increases the Hall mobility. , …”
Section: Resultssupporting
confidence: 93%
“…The electrical conductivity obtained ranges from 2 to 6 S cm −1 . These values are about 4 times lower than in the literature [40,46]. The slightly lower values may be due to the manufacturing process and layer thickness determination.…”
Section: Thermoelectric Investigationscontrasting
confidence: 58%
“…The summarized measured and calculated values of open-circuit voltage, short-circuit current, maximal power output, Seebeck coefficient, electric conductivity and power factor for different temperatures (see Figure 4). Optimization of the electrical and thermoelectric properties can be achieved by layer optimization with respect to processes and thickness parameters or, as described in [46], by a subsequent annealing process. In [46] is presented how an additional annealing process affects the electrical and structural properties of CuI and how the thermoelectric properties can be improved by changing the native defect structure in the lattice.…”
Section: Thermoelectric Investigationsmentioning
confidence: 99%