2005
DOI: 10.1149/1.2048167
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Effect of MgO Dopant on the Microstructure and Dielectric Properties of rf-Sputtered Ba[sub 0.5]Sr[sub 0.5]TiO[sub 3] Thin Films

Abstract: MgO-doped Ba 0.5 Sr 0.5 TiO 3 ͑BST͒ thin films were synthesized by radio-frequency ͑rf͒ magnetron sputtering at substrate temperature 750°C using single-phase targets with different MgO contents ranging from 0 to 5 mol %. Microstructure, surface morphology, dielectric constant, and leakage current of the MgO-doped BST films were characterized to understand the influence of the MgO dopant on film properties. Polycrystalline and single-phase solid solution films with a dense microstructure were obtained in all d… Show more

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Cited by 16 publications
(5 citation statements)
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“…This 1% dopant rate has been found to be optimum 7 for reducing the leakage current, the dielectric losses, and the low frequency charge carrier diffusion. 7,10,11 Platinum top electrodes have been deposited by RF sputtering in order to realize a MIM capacitor. The capacitance and the dielectric loss factor (tan d) have been measured using an Agilent 4294A impedance meter at 100 kHz.…”
Section: Methodsmentioning
confidence: 99%
“…This 1% dopant rate has been found to be optimum 7 for reducing the leakage current, the dielectric losses, and the low frequency charge carrier diffusion. 7,10,11 Platinum top electrodes have been deposited by RF sputtering in order to realize a MIM capacitor. The capacitance and the dielectric loss factor (tan d) have been measured using an Agilent 4294A impedance meter at 100 kHz.…”
Section: Methodsmentioning
confidence: 99%
“…The dielectric properties are strongly related to the quality of the material and more especially to the presence of defects. In ferroelectric thin films, oxygen vacancies are the predominant defects which participate to the conduction losses by releasing free electrons and generating dangling bonds in the material structure 5,6 . However, in order to minimize these losses, it is possible to perform doping of the material by substitution of one of the lattice ions by an ion of different valence.…”
Section: Introductionmentioning
confidence: 99%
“…1% manganese doping in substitution of the Ti-ions has been employed in order to reduce the low frequency diffusion and high frequency losses [14]. Electron acceptor doping permits us to compensate for oxygen vacancies which are the main defects that contribute to the conduction losses in ferroelectric thin films [14][15][16]. Moreover, manganese doping helps reduce the domain wall motion contribution to the permittivity which is very dissipative [14].…”
mentioning
confidence: 99%