2012
DOI: 10.1007/s10853-012-6565-1
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Effect of lattice misfit on the transition temperature of VO2 thin film

Abstract: Vanadium dioxide thin films were deposited on c-cut sapphire and MgO(111) substrate using pulsed laser deposition method to investigate the effect of lattice misfit between the thin film and the substrate on the transition temperature of VO 2 thin film. All vanadium dioxide thin films showed heteroepitaxial growth with (002) preferred orientation. VO 2 /c-sapphire and VO 2 /MgO(111) had different transition temperatures, regardless of the thickness, orientation, and deposition conditions of the thin film. Thes… Show more

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Cited by 46 publications
(15 citation statements)
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“…13 The luminous transmittance can be boosted by magnesium substitution [14][15] and by fluorination. 16 The metal-insulator transition can be influenced by a variety of external parameters, and recent work have considered the effects of strain [17][18][19] and lattice misfit with the substrate, 20,21 electric field or current activation, [22][23][24][25][26][27][28][29][30][31] light irradiation, [32][33][34][35][36][37][38] ion bombardment, 39,40 and gaseous ambience. 41 Considering the wealth of possibilities to modulate the properties of VO 2 -based thin films, it is not surprising that they are discussed for a vast number of applications such as thermochromic "smart" windows for energy efficient buildings, [42][43][44][45][46][47][48][49][50] variable-thermal-emittance surfaces for thermal radiation control, 51 oscillators and switches in (opto)electronics, 25,26,34,52,53 transistors of different types, <...>…”
Section: Introductionmentioning
confidence: 99%
“…13 The luminous transmittance can be boosted by magnesium substitution [14][15] and by fluorination. 16 The metal-insulator transition can be influenced by a variety of external parameters, and recent work have considered the effects of strain [17][18][19] and lattice misfit with the substrate, 20,21 electric field or current activation, [22][23][24][25][26][27][28][29][30][31] light irradiation, [32][33][34][35][36][37][38] ion bombardment, 39,40 and gaseous ambience. 41 Considering the wealth of possibilities to modulate the properties of VO 2 -based thin films, it is not surprising that they are discussed for a vast number of applications such as thermochromic "smart" windows for energy efficient buildings, [42][43][44][45][46][47][48][49][50] variable-thermal-emittance surfaces for thermal radiation control, 51 oscillators and switches in (opto)electronics, 25,26,34,52,53 transistors of different types, <...>…”
Section: Introductionmentioning
confidence: 99%
“…Growth at high substrate temperature to overcome the kinetic barrier to oxidation is not an option for two reasons: (1) the rapid interdiffusion of VO 2 into the underlying substrates [50,52,54] and (2) if the entire film is oxidized to V 2 O 5 , it will all evaporate due to the high vapor pressure of V 2 O 5 . [55] Despite the many challenges involved in the growth of VO 2 films, significant advances have been achieved in its deposition using PLD, [42,[56][57][58][59][60][61][62][63] MBE, [52,53,64,65] sputtering, [66][67][68][69][70][71][72][73] electronbeam deposition, [74] ion-beam depostion, [75] metalorganic [48,49] (c) Resistivity versus temperature for various V-O phases, with a MIT at different temperatures. While V 2 O 3 exhibits the largest change in resistivity over eight orders of magnitude, but below room temperature, VO 2 has the largest resistivity ratio above room temperature of about five orders of magnitude.…”
Section: Thin-film Growth Of Vomentioning
confidence: 99%
“…From Table 1, the single-layer VO 2 thin films have higher T c than the buffered VO 2 thin films. After introducing the buffer layer (40 nm and 80 nm in thickness), the T c values of VO 2 thin films are similar to that of the bulk VO 2 single crystal (68 • C), which is generally due to the release of stress [31]. The ∆R values of the VO 2 /glass thin films are slightly larger than those of the 40-and 80-nm-thick VO 2 /Cu 50 Zr 50 /glass thin films.…”
Section: Electrical Propertiesmentioning
confidence: 82%