2008
DOI: 10.1016/j.apsusc.2008.04.012
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Effect of intrinsic stress on the optical properties of nanostructured ZnO thin films grown by rf magnetron sputtering

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Cited by 109 publications
(41 citation statements)
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“…The σ film values are observed to be about 2.509 GPa, 2.092 GPa, 0.107 GPa and 0.106 GPa for the GZO thin films deposited at the growth temperatures of 300°C, 350°C, 400°C and 450°C, respectively. It indicates that the residual stress in the thin films is obviously relaxed with the increase of growth temperature, which is in good agreement with the results obtained by Kumar et al [37] in ZnO film. 3a depicts the wide-scan XPS spectrum of the GZO thin films deposited at the growth temperature of 400°C.…”
Section: Thin Films Characterizationsupporting
confidence: 82%
“…The σ film values are observed to be about 2.509 GPa, 2.092 GPa, 0.107 GPa and 0.106 GPa for the GZO thin films deposited at the growth temperatures of 300°C, 350°C, 400°C and 450°C, respectively. It indicates that the residual stress in the thin films is obviously relaxed with the increase of growth temperature, which is in good agreement with the results obtained by Kumar et al [37] in ZnO film. 3a depicts the wide-scan XPS spectrum of the GZO thin films deposited at the growth temperature of 400°C.…”
Section: Thin Films Characterizationsupporting
confidence: 82%
“…There have been lot of studies on the luminescent properties of ZrO 2 , but still there is a lack of clarification for the luminescent mechanisms in ZrO 2 . In general, luminescence from NPs is thought to be related to defects and/or impurities in the system [25,[29][30][31][32]. In ZrO 2 -NPs, the involvement of mid gap traps such as surface defects and oxygen vacancies defects (F+ centers) make contribution towards luminescence properties.…”
Section: Temperature ( • C) Phases Compositionmentioning
confidence: 99%
“…Scherrer's formula [37], the internal stress σ, derived from the change in the 'c' lattice parameter [38] …”
mentioning
confidence: 99%