Effect of Interfacial Roughness Configuration on the Exchange-Bias Field in NiO Based Spin Valves

Zhang, A. M.; Cai, Hong‐Ling; Wu, Xinglong

doi:10.1007/s10948-010-0654-7

Cited by 4 publications

(2 citation statements)

References 14 publications

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“…The nickel oxide (NiO) has attracted much attention and it has been used in magnetic devices, antibacterial applications, catalysis, electrode materials, sensors and electrical devices [9][10][11][12][13][14][15][16][17].…”

Section: Introductionmentioning

confidence: 99%

Unusual magnetic properties of NiO nanoparticles embedded in a silica matrix

Tadić

Panjan

Marković

et al. 2011

Journal of Alloys and Compounds

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Section: Introductionmentioning

confidence: 99%

Unusual magnetic properties of NiO nanoparticles embedded in a silica matrix

Tadić

Panjan

Marković

et al. 2011

Journal of Alloys and Compounds

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“…However, due to the wide variety of materials and deposition techniques used, the dependence of the EB field (H ex ) on the roughness is still controversial. For several systems, the H ex seems to be relatively insensitive to the roughness value [7,11], while in others the H ex varies in direct proportion to the roughness [9,10] or indicates an opposite variation [8]. Research has also shown that the relationship between the H ex and the roughness value is totally different for differently prepared samples [12].…”

Section: Introductionmentioning

confidence: 99%

Ferromagnetic Resonance and X-Ray Reflectivity Studies of Pulsed DC Magnetron Sputtered NiFe/IrMn/CoFe Exchange Bias

Öksüzoğlu¹,

Akman²,

Yıldırım³

et al. 2012

Journal of Magnetics

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Ferromagnetic resonance and X-ray specular reflectivity measurements were performed on Ni 81 Fe 19 /Ir 20 Mn 80 / Co 90 Fe 10 exchange bias trilayers, which were grown using the pulsed-DC magnetron sputtering technique on Si(100)/SiO 2 (1000 nm) substrates, to investigate the evolution of the interface roughness and exchange bias and their dependence on the NiFe layer thickness. The interface roughness values of the samples decrease with increasing NiFe thickness. The in-plane ferromagnetic resonance measurements indicate that the exchange bias field and the peak-to-peak line widths of the resonance curves are inversely proportional to the NiFe thickness. Furthermore, both the exchange bias field and the interface roughness show almost the same dependence on the NiFe layer thickness. The out-of plane angular dependent measurements indicate that the exchange bias arises predominantly from a variation of exchange anisotropy due to changes in interfacial structure. The correlation between the exchange bias and the interface roughness is discussed.

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