2022
DOI: 10.1017/s1431927622003671
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Effect of Induced Stimuli on the Leakage Current of Operative Oxide-based Devices inside a TEM

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“…It is worth noting that the TEM specimen was fixed on the chip surface solely by van der Waals forces, thereby avoiding any contamination from FIB-deposited material. 45 At 20 C, as illustrated in Fig. 3(a), the a 1 /a 2 90 ferroelastic needle domain groups align parallel to the [ 110] direction, corroborating our optical observations (Figs.…”
supporting
confidence: 86%
“…It is worth noting that the TEM specimen was fixed on the chip surface solely by van der Waals forces, thereby avoiding any contamination from FIB-deposited material. 45 At 20 C, as illustrated in Fig. 3(a), the a 1 /a 2 90 ferroelastic needle domain groups align parallel to the [ 110] direction, corroborating our optical observations (Figs.…”
supporting
confidence: 86%