Effect of Humidity Exposure on Microstructure and Photoluminescence Properties of Polycrystalline CsI(Tl) Screens

Abstract

CsI(Tl) scintillation screens have been widely applied in X-ray nondestructive testing (NDT) because of their low cost, high scintillation efficiency, and fluorescence guide columnar microstructures. The effect of humidity exposure on the microstructure and photoluminescence properties of polycrystalline CsI(Tl) screens was investigated in this work. The results indicate that the grain diameter of the columnar microstructure increased with increased exposure time in a humid environment. The degree of anisotropy of polycrystalline screens changed from (211) and (310) to (110) orientation with exposure time. FT-IR Spectra of the exposed screens peaked at 3734 cm−1, 3710 cm−1, 3676 cm−1, 3647 cm−1, 3627 cm−1, 3598 c−1, and 3566 cm−1 due to the symmetrical and asymmetrical stretching vibrations of water molecules. In addition, the photoluminescence properties of exposed screens decreased with increased humidity exposure time due to the deliquescence caused by water molecules. After hours of humidity exposure, the photoluminescence and imaging properties of the screens decrease obviously and tend to reduce slowly. The moisture absorption and deliquescence would directly affect the service reliability and the storage lifetime of polycrystalline CsI(Tl) screens.