“…The conduction mechanisms of the Ag/Cu x O/FTO, Ag/ZnO/FTO, Ag/NiO/FTO Ag/ZnO/Cu x O/FTO, and Ag/NiO/Cu x O/FTO devices are investigated by fitting appropriate charge transport models to the experimental I – V data, as shown in Figures S6, S7, S8, S9, and S10, respectively. Several charge transport models are available in the literature, including but not limited to Ohmic, Child’s square law, Poole–Frenkel, Hopping, and Fowler–Nordheim. , The best-fitting results for the charge transport are presented here. The model-fitting results obtained from the fabricated devices suggest that the positive-biased low- and high-voltage region HRS I – V data are well-fitted to the Ohmic and Child’s square law conduction models, respectively.…”