Effect of finite metallization and inhomogeneous dopings on slow-wave-mode propagation

Quasi-TM MoL/MoM approach for computing the transmission-line parameters of lossy lines

“…Further analysis of MIS transmission lines using a full-wave analysis have been carried out using, for instance, mode-matching techniques, [4], [5], the method of lines (MoL) [6], and the spectral-domain approach (SDA) [7], [8]. More complete full-wave analysis including conductor losses have been carried out by the MoL [9], [10] or by means of discretization techniques such as the finite-difference time-domain (FDTD) method [11], and finite-element method (FEM) [12], [13]. A great number of models based on quasi-static approaches can also be found in the literature.…”

“…The analysis will follow the quasi-TM approach reported in [15] and will be extended to include the nontrivial case of nonperfect metallic thick conductors. The inclusion of conductor losses is of special importance from a practical point-of-view considering that they can dominate the overall losses even at relatively high frequencies if narrow strip are used [13], [16]. From the quasi-TM approach, a transmission-line model has been developed by properly defining the line voltage and current, as well as the per unit length (p.u.l.)…”

Finite-element method coupled with method of lines for the analysis of planar or quasi-planar transmission lines

“…In some applications, the transmission lines may be designed with complex geometric parameters and/or contain inhomogeneous materials. For example, abrupt or inhomogeneously doped semiconductor substrates have been used to improve the quality factor and the slow-wave characteristics of metal-insulator-semiconductor (MIS) transmission lines [1]- [4]. Conductors with finite thickness and nonrectangular edge profile, which result from the underetching or electrolytical growth during the fabrication process, are often present in monolithic microwave integrated circuits (MMICs) or high-speed interconnects.…”

“…Rigorous full-wave analysis of transmission-line structures containing complex geometric/material features can be carried out using several numerical techniques. There have been papers reported that using the finite-element method (FEM) [1], method of lines (MoL) [2], transmission-line matrix (TLM) method [3], and mode-matching technique in conjunction with Galerkin's method [4], [18], [19] to investigate the propagation characteristics of microstrips and coplanar waveguides fabricated on an inhomogeneous substrate. In addition, the effects of conductor thickness and edge profile on transmission properties were studied by the boundary integral equation method [5], the spectral-domain approach (SDA) [6], and FEM [7], [8].…”

Construction of the Dirichlet to Neumann Boundary Operator for Triangles and Applications in the Analysis of Polygonal Conductors

“…In [4] a single lossy line in the presence of a semiconducting substrate is analysed in the quasi-TM limit. The conductor losses can even become dominant for narrow strip configurations [5]. In [6] this quasi-TM analysis is extended to multiconductor lines in the presence of a semiconducting substrate.…”