2009
DOI: 10.1007/s10832-009-9584-9
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Effect of excess PbO on microstructure and orientation of PZT(60/40) films

Abstract: Lead zirconate titanate [PZT(60/40)] films were deposited by RF-magnetron sputtering using single oxide targets with various levels of excess PbO. The excess PbO in the film played an important role in the pyrochlore-toperovskite transformation, nucleation and growth processes, orientation control, and crack formation. When 5% or 20% excess PbO was added to the target, pyrochlore phases were created and the films were severely cracked. However, the films had a perovskite structure without any pyrochlore phases… Show more

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Cited by 17 publications
(6 citation statements)
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“…XRD shows that high lead excess modifies the preferential (100) orientation to a mixed state dominated by (111), in agreement with previous results [33,34]. However, the Pb chemistry is the same at the surface of PZT30 and PZT10.…”
Section: Discussionsupporting
confidence: 91%
“…XRD shows that high lead excess modifies the preferential (100) orientation to a mixed state dominated by (111), in agreement with previous results [33,34]. However, the Pb chemistry is the same at the surface of PZT30 and PZT10.…”
Section: Discussionsupporting
confidence: 91%
“…However, some additional peaks were observed on the diffractogram because of the formation of unwanted pyrochlore phase. This phase is related to the excess lead (II) nitrate to compensate for PbO evaporation during heating at higher temperatures . However, after further sintering at 1250°C, no trace of pyrochlore phases is detected.…”
Section: Resultsmentioning
confidence: 97%
“…This phase is related to the excess lead (II) nitrate to compensate for PbO evaporation during heating at higher temperatures. 36,37 However, after further sintering at 1250°C, no trace of pyrochlore phases is detected. Due to the changes in crystallite size, the intensity and broadening of the peaks change in different pH values.…”
Section: Xrd Analysismentioning
confidence: 99%
“…The Zr:Ti ratio matches closely the Zr 0,52 Ti 0,48 target stoichiometry for all samples and does not substantially change with annealing conditions. 26 B. Crystalline phases GIXRD spectra are shown in Fig. After the thermal treatments the Pb content decreases monotonically with increasing annealing temperature, almost reaching the target stoichiometry for PZT films on Si and Au electrodes, while the decrease of Pb content is less pronounced for PZT films on ITO and Pt electrodes.…”
Section: A Film Compositionmentioning
confidence: 99%