2000
DOI: 10.1134/1.1131305
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Effect of electric current on starting characteristics and activation parameters of short dislocations in Si crystals

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Cited by 8 publications
(3 citation statements)
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“…This can be caused by the simultaneous action of two opposite factors: electron generation and electron-hole recombination. It is known [10,[17][18] that Xirradiation of p-Si crystals leads to an increase in the dislocation path by about 3-4 times. In this case, the effect of increasing the mileage increases with an increase in the absorbed radiation dose, that is, there is a radiation-plastic effect.…”
Section: Resultsmentioning
confidence: 99%
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“…This can be caused by the simultaneous action of two opposite factors: electron generation and electron-hole recombination. It is known [10,[17][18] that Xirradiation of p-Si crystals leads to an increase in the dislocation path by about 3-4 times. In this case, the effect of increasing the mileage increases with an increase in the absorbed radiation dose, that is, there is a radiation-plastic effect.…”
Section: Resultsmentioning
confidence: 99%
“…The redistribution of the concentration of charge carriers, and the evolution of structural defects in deformed and X-ray irradiated p-Si crystals is largely determined by the perfection of the starting material, the presence and mobility of dislocations, which are drains for charges and defects, especially in the near-surface region [8]. In addition, a surface with sprayed metal contacts is an effective getter for deep-level structural defects [9,10]. The discrepancy between the parameters of the crystal lattices and the metal contact sprayed on it leads to the appearance of local mechanical stresses [11].…”
Section: Introductionmentioning
confidence: 99%
“…Redistribution of carrier concentration and impurities in deformed crystals are often characterized by the presence of dislocations which are effective getters of defects, especially on the surface of the crystal [ 4 , 5 ]. It is known [ 3 , 6 ] that the excitation of crystal electronic subsystems is also accompanied by the corresponding changes in the dislocation mobility. Excitation of the electronic subsystems could be as a result of external influence, such as radiation and electrostatic field.…”
Section: Introductionmentioning
confidence: 99%