Effect of composition on structure and properties of Se100−xAsx amorphous films with low As content (x ⩽ 10)

Luksha, O. V.; Mikla, Victor I.; Ivanitsky, V. P.; Mateleshko, A. V.; Семак, Д. Г.

doi:10.1016/s0022-3093(05)80408-9

Cited by 6 publications

(2 citation statements)

References 15 publications

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“…All the compositions measured show a relatively well resolved diffraction peak at Q(=4π sin θ/λ) ∼ 1-1.5 Å−1 , often termed the first sharp diffraction peak (FSDP), indicative [15,16] of appreciable medium-range order. The intensity and the position of the FSDP change with compositional variation.…”

Section: Total Diffractionmentioning

confidence: 99%

Distinct topological regimes in binary glasses

Mikla

1997

J. Phys.: Condens. Matter

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In the binary glass system, a change of structural regime takes place near the composition . The presence of this topological threshold is established by direct and indirect evidence, such as peculiarities in the compositional dependence of the Raman vibrational modes, optical band-gap energy and drift mobilities of glasses. These peculiarities are caused by the transition from a chain - ring-like structure to chainlike structure.

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Section: Total Diffractionmentioning

confidence: 99%

Distinct topological regimes in binary glasses

Mikla

1997

J. Phys.: Condens. Matter

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“…Figure 1 shows a typical XRDpattern, using the Cu Ka line, for as-deposited germanium sulphide ¢lms. The ¢rst sharp di¡raction peak (FSDP), which is observed at an angle of 2y % 14 , is associated with the medium-range order of the amorphous structure [11,12].…”

Section: Methodsmentioning

confidence: 99%

Optical Constants in the Subgap Region and Vibrational Behaviour by Far-Infrared Spectroscopy of Wedge-Shaped Obliquely-Deposited Amorphous GeS₂Films

et al. 1999

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Optical transmission spectra are very sensitive to inhomogeneities of thin ¢lms. In particular, non-uniform ¢lm thickness leads to shrinking of the transmission spectrum at normal incidence. This non-uniformity has to be taken into account, because its ignorance may lead to serious errors in the calculated values of the refractive index and the ¢lm thickness. This paper presents a method, which transforms the optical transmission spectrum of a wedge-shaped thin ¢lm into a spectrum of a uniform ¢lm whose thickness is equal to the average thickness of the non-uniform ¢lm. This allows to calculating the refractive index, the average thickness, as well as a parameter indicating the degree of ¢lm thickness uniformity. The method is successfully applied to wedge-shaped obliquely-deposited chalcogenide glass thin ¢lms of chemical composition GeS 2 . The dispersion of the refractive index in the subgap region is discussed in terms of the Wemple-DiDomenico singleoscillator model. The optical-absorption edge is described using the `non-direct transition' model suggested by Tauc, and the optical gap is calculated by Tauc's extrapolation. Far-infrared spectroscopy has been used to clearly complement the results derived from the present optical measurements.

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Optical properties of As50Se50 semiconducting glass films of non-uniform thickness deposited by thermal evaporation

Ramírez-Malo¹,

Corrales²,

Márquez³

et al. 1995

Materials Chemistry and Physics

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Effect of composition on structure and properties of Se100−xAsx amorphous films with low As content (x ⩽ 10)

Cited by 6 publications

References 15 publications

Distinct topological regimes in binary glasses

Distinct topological regimes in binary glasses

Optical Constants in the Subgap Region and Vibrational Behaviour by Far-Infrared Spectroscopy of Wedge-Shaped Obliquely-Deposited Amorphous GeS₂Films

Optical properties of As50Se50 semiconducting glass films of non-uniform thickness deposited by thermal evaporation

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Effect of composition on structure and properties of Se100−xAsx amorphous films with low As content (x ⩽ 10)

Cited by 6 publications

References 15 publications

Distinct topological regimes in binary glasses

Distinct topological regimes in binary glasses

Optical Constants in the Subgap Region and Vibrational Behaviour by Far-Infrared Spectroscopy of Wedge-Shaped Obliquely-Deposited Amorphous GeS2Films

Optical properties of As50Se50 semiconducting glass films of non-uniform thickness deposited by thermal evaporation

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Product

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Optical Constants in the Subgap Region and Vibrational Behaviour by Far-Infrared Spectroscopy of Wedge-Shaped Obliquely-Deposited Amorphous GeS₂Films