1992
DOI: 10.1016/s0022-3093(05)80408-9
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Effect of composition on structure and properties of Se100−xAsx amorphous films with low As content (x ⩽ 10)

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Cited by 6 publications
(2 citation statements)
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“…All the compositions measured show a relatively well resolved diffraction peak at Q(=4π sin θ/λ) ∼ 1-1.5 Å−1 , often termed the first sharp diffraction peak (FSDP), indicative [15,16] of appreciable medium-range order. The intensity and the position of the FSDP change with compositional variation.…”
Section: Total Diffractionmentioning
confidence: 99%
“…All the compositions measured show a relatively well resolved diffraction peak at Q(=4π sin θ/λ) ∼ 1-1.5 Å−1 , often termed the first sharp diffraction peak (FSDP), indicative [15,16] of appreciable medium-range order. The intensity and the position of the FSDP change with compositional variation.…”
Section: Total Diffractionmentioning
confidence: 99%
“…Figure 1 shows a typical XRDpattern, using the Cu Ka line, for as-deposited germanium sulphide ¢lms. The ¢rst sharp di¡raction peak (FSDP), which is observed at an angle of 2y % 14 , is associated with the medium-range order of the amorphous structure [11,12].…”
Section: Methodsmentioning
confidence: 99%