2021
DOI: 10.1016/j.solmat.2021.110989
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Effect of Cd diffusion on the electrical properties of the Cu(In,Ga)Se2 thin-film solar cell

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Cited by 12 publications
(8 citation statements)
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“…Assuming dominant recombination in the SCR at V % V OC , the observed reduction in doping density by a factor of % 7 leads to a V OC loss of % 25-50 mV (depending on the ideality factor), [56] which is in the range measured in this study. That may also explain why the V OC values decrease again for very low [I]/ [III], where the doping apparently decreases again.…”
Section: Origin Of V Oc àJ Sc Anticorrelation With Varying Stoichiometrymentioning
confidence: 54%
“…Assuming dominant recombination in the SCR at V % V OC , the observed reduction in doping density by a factor of % 7 leads to a V OC loss of % 25-50 mV (depending on the ideality factor), [56] which is in the range measured in this study. That may also explain why the V OC values decrease again for very low [I]/ [III], where the doping apparently decreases again.…”
Section: Origin Of V Oc àJ Sc Anticorrelation With Varying Stoichiometrymentioning
confidence: 54%
“…Figure 17 shows the schematic band alignments of the CIGS/ CdS interface for the 30 and 60 nm CdS thin films considering the approximate band bending by Cd diffusion. [43][44][45][46] To investigate the schematic changes in the band alignment by thickness with and without HT, the mean ΔE C change of the band alignment for the 30 nm CdS layer was exhibited. The band alignment here is based on the CBM calculated by UPS and UV measurements as mentioned earlier, so it is approximate alignment compared to the CBM values obtained by IPES measurements.…”
Section: Detailed Mechanism Study and Establishing Optimized Buffer Layer Formation Conditionsmentioning
confidence: 99%
“…Last but not least, the chemical roughness of Li-bulk/LLZO heterointerface of about 15 nm is much superior than the typical roughness of less than 5 nm detected in typical semiconductor heterostructures. [30][31][32][33] Furthermore, the design of the next generation of green energy materials requires understanding the relationship between composition, structure, and electronic properties down to the interface level. This had not been possible to achieve until recently.…”
Section: Apt-based Correlative Microscopy and Techniquesmentioning
confidence: 99%