2016
DOI: 10.1088/0957-4484/27/34/345301
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Effect of carrier tunneling on the structure of Si nanowires fabricated by metal assisted etching

Abstract: The metal assisted etching mechanism for Si nanowire fabrication, triggered by doping type and level and coupled with choice of metal catalyst, is still very poorly understood. We explain the different etching rates and porosities of wires we observe based on extensive experimental data, using a new empirical model we have developed. We establish as a key parameter, the tunneling through the space charge region (SCR) which is the result of the reduction of the SCR width by level of the Si wafer doping in the p… Show more

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Cited by 21 publications
(25 citation statements)
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“…However, the p-type doped samples with the lower ratio of etching solution (i.e., p + ) and p, see Table 1) show a relatively intense deep at the Si edge which might indicate higher crystalline Si content, compared to the p-type sample etched in the higher oxidizing agent solution (i.e., p 0 ). This agrees with higher oxidation rate via this solution and higher porosity of samples, as reported previously [15]. Furthermore, the n-type sample shows a relatively consistent features with its surface counterpart, though with a slight shift of the Si edge.…”
Section: Resultssupporting
confidence: 91%
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“…However, the p-type doped samples with the lower ratio of etching solution (i.e., p + ) and p, see Table 1) show a relatively intense deep at the Si edge which might indicate higher crystalline Si content, compared to the p-type sample etched in the higher oxidizing agent solution (i.e., p 0 ). This agrees with higher oxidation rate via this solution and higher porosity of samples, as reported previously [15]. Furthermore, the n-type sample shows a relatively consistent features with its surface counterpart, though with a slight shift of the Si edge.…”
Section: Resultssupporting
confidence: 91%
“…MAcE fabricated silicon nanowires have shown fabrication dependent morphology based on the etching solutions, metal used in the process and the doping type and level (more information can be found in Ref. [15]). An example of scanning electron microscopy (SEM) of p-doped silicon nanowires fabricated via MAcE is shown in Figure 2.…”
Section: Resultsmentioning
confidence: 99%
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“…12 Metal assisted chemical etching (MAcE) is a simple and economically favored method currently used to fabricate Si NWs, offering a large variety of controllability over the Si wires parameters. 13,14 However, MAcE is not effective for Ge NWs fabrication. Although exact phenomena preventing Ge NWs by MAcE are not profoundly comprehended, it can be postulated to be attributed to the following factors.…”
mentioning
confidence: 99%