2018
DOI: 10.1016/j.apsusc.2017.09.016
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Effect of annealing on chemical, structural and electrical properties of Au/Gd2O3/n-GaN heterostructure with a high-k rare-earth oxide interlayer

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Cited by 56 publications
(10 citation statements)
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“…The stretching vibrations of -OH (3339 cm −1 ), C=C (1634 cm −1 ), C-O (1217 cm −1 ) and C-O-C (1054 cm −1 ) were discovered by an FTIR scan of GO. The PGO-Gd spectra displayed stretching vibrations at 3617 cm −1 (-OH), 1515 cm −1 (C=C), 1380 cm −1 (C-OH), and 1217 cm −1 (C-O-H) and Gd2O3 spectra observed Gd-O stretching (514 cm −1 ), and this is consistent with prior results [36]. Furthermore, the strong stretching peak at 710 cm −1 indicates Gd(OH)3 [39].…”
Section: Pgo-gd Structural Chracterizationsupporting
confidence: 91%
See 1 more Smart Citation
“…The stretching vibrations of -OH (3339 cm −1 ), C=C (1634 cm −1 ), C-O (1217 cm −1 ) and C-O-C (1054 cm −1 ) were discovered by an FTIR scan of GO. The PGO-Gd spectra displayed stretching vibrations at 3617 cm −1 (-OH), 1515 cm −1 (C=C), 1380 cm −1 (C-OH), and 1217 cm −1 (C-O-H) and Gd2O3 spectra observed Gd-O stretching (514 cm −1 ), and this is consistent with prior results [36]. Furthermore, the strong stretching peak at 710 cm −1 indicates Gd(OH)3 [39].…”
Section: Pgo-gd Structural Chracterizationsupporting
confidence: 91%
“…In Figure 2a, the peak of C 1s signal is observed at 283.49 eV, and the signal at 529.37 eV is attributed to O 2− , which corresponds to GO [35]. The Gd 4d XPS plot indicates that the signal at 141.4 eV is attributed with Gd 3+ [36,37]. Hence, the XPS analysis confirmed the formation of PGO-Gd.…”
Section: Pgo-gd Structural Chracterizationmentioning
confidence: 73%
“…GaN is a wide direct band gap material that has excellent optical properties and good physical/chemical stability even at higher temperatures, offering a wide range of applications in electro-optoelectronic devices such as diodes, LEDs, photodiodes, and field-effect transistors. Similar to a ZnO material, GaN has high-level piezoelectric properties owing to its non-centrosymmetric wurtzite crystal structure. The development of piezotronic sensors based on nanostructures and nano thin films has accelerated since the discovery of materials such as graphene .…”
Section: Introductionmentioning
confidence: 99%
“…3a, c, the statistical analysis provides average barrier height values of 0.70 eV and 0.84 eV with normalization deviation of 0.02 eV and 0.08 eV for the Au/n-GaN SJ and Au/Fe 3 O 4 /n-GaN HJ, respectively. The barrier height estimated for the Au/Fe 3 O 4 /n-GaN HJ compared with that of the reported barrier height values obtained for the other devices in the literature, for instance, is 0.72 eV for Al/Fe 3 O 4 /p-Si junction [30], 0.88 eV for Au/Fe 3 O 4 /p-Si Schottky contacts [31], 0.82 eV for Au/CZTS/n-GaN HJ [32], 0.98 eV for Au/ Gd 2 O 3 /n-GaN HJ [33], 0.94 eV Au/ZrO 2 /n-GaN MIS junction (4) [34]. It is noted that the average barrier height difference between Au/n-GaN SJ and Au/Fe 3 O 4 /n-GaN HJ is 0.14 eV.…”
Section: Resultsmentioning
confidence: 96%