2006
DOI: 10.1016/j.tsf.2005.09.093
|View full text |Cite
|
Sign up to set email alerts
|

Effect of annealing of poly(3-hexylthiophene)/fullerene bulk heterojunction composites on structural and optical properties

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

9
135
2

Year Published

2007
2007
2019
2019

Publication Types

Select...
8
2

Relationship

0
10

Authors

Journals

citations
Cited by 163 publications
(146 citation statements)
references
References 19 publications
9
135
2
Order By: Relevance
“…It has been reported that postfabrication annealing of films of OPVC material pairs 5,53 and pure C60 layers 24 was able to impact the structural, surface and electrical properties, which can lead to a device efficiency improvement. Therefore, we investigated the impact of annealing on the PEN+ C60 film deposited on the PEN underlayer; the XRD results are shown in Fig.…”
Section: Structural Investigationsmentioning
confidence: 99%
“…It has been reported that postfabrication annealing of films of OPVC material pairs 5,53 and pure C60 layers 24 was able to impact the structural, surface and electrical properties, which can lead to a device efficiency improvement. Therefore, we investigated the impact of annealing on the PEN+ C60 film deposited on the PEN underlayer; the XRD results are shown in Fig.…”
Section: Structural Investigationsmentioning
confidence: 99%
“…1,2 Thermal or solvent annealing is typically used to alter the morphology of the device active layer on the nanoscale. [3][4][5][6] However, the blend film structure is a complex interplay of crystalline and amorphous mixed and demixed regions.…”
mentioning
confidence: 99%
“…[1][2][3][4] Like other organic electronic devices, [5][6][7] charge injection at the organicinorganic interface is a key issue for OPVs. 8,9 Surface treatments of electrode including oxidation, the addition of a selfassembled layer, [10][11][12][13][14] or poly͑3,4-ethylene dioxythiophene͒: poly͑styrene-sulfonate͒ ͑PEDOT:PSS͒ layer insertion 15 can lower or raise the work functions of cathodes and anodes, or enhance the cohesion, and thus lower the interfacial series resistance.…”
mentioning
confidence: 99%