2021
DOI: 10.1007/s10854-021-06688-7
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Effect of annealing dynamics on the ion-engineered CdTe/ZnTe solar cells

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“…As stated, these properties can be analyzed using different characterization tools such as X-ray diffractometer (XRD), UV-vis spectrophotometer, PL spectrometer, source meter, atomic force microscope (AFM), scanning electron microscope (SEM), and energy dispersive spectroscope (EDS). [183][184][185][186][187][188][189][190][191][192] The influence of different factors on the properties of ZnTe films is discussed in detail herein.…”
Section: Impact Of Doping and Post Treatment On Physical Propertiesmentioning
confidence: 99%
“…As stated, these properties can be analyzed using different characterization tools such as X-ray diffractometer (XRD), UV-vis spectrophotometer, PL spectrometer, source meter, atomic force microscope (AFM), scanning electron microscope (SEM), and energy dispersive spectroscope (EDS). [183][184][185][186][187][188][189][190][191][192] The influence of different factors on the properties of ZnTe films is discussed in detail herein.…”
Section: Impact Of Doping and Post Treatment On Physical Propertiesmentioning
confidence: 99%