2009
DOI: 10.1016/j.colsurfa.2008.09.025
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Effect of anion on micro/nano-tribological properties of ultra-thin imidazolium ionic liquid films on silicon wafer

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Cited by 55 publications
(51 citation statements)
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“…This provides greater resistance to tip sliding, leading to higher coefficient of friction values. It is worth noting that comparable results were obtained by other groups who performed AFM-based adhesion and friction measurements on untreated IL films on silicon [74][75][76][77][78]. The role of meniscus formation in the adhesive and friction forces obtained for the uncoated Si and the untreated, partially bonded and fully bonded lubricant-coated Si surfaces is depicted in the schematic at the lower portion of Fig.…”
Section: Nanotribological Studiessupporting
confidence: 79%
“…This provides greater resistance to tip sliding, leading to higher coefficient of friction values. It is worth noting that comparable results were obtained by other groups who performed AFM-based adhesion and friction measurements on untreated IL films on silicon [74][75][76][77][78]. The role of meniscus formation in the adhesive and friction forces obtained for the uncoated Si and the untreated, partially bonded and fully bonded lubricant-coated Si surfaces is depicted in the schematic at the lower portion of Fig.…”
Section: Nanotribological Studiessupporting
confidence: 79%
“…Table 1 lists hydrophilic and hydrophobic ILs used in this study. All ILs used were purchased from Tokyo Chemical Industry Co. (Tokyo, Japan) and were ultrapurified to make them usable for SEM (Jimenez and Bermudez, 2009;Wilkes and Zaworotko, 1992;Zhao et al, 2009). We followed the newly developed protocol for SEM with IL (Ishigaki et al, 2011a), with slight modifications.…”
Section: Methodsmentioning
confidence: 99%
“…To study surface morphology of thin films on a micro-and a nano-scale, atomic force microscopy (AFM) is considered as an excellent tool [14,15]. The surface roughness of one bilayer DR/PAA-CNTs film and five bilayers films on mica was visualized using AFM in tapping mode, as shown in Fig.…”
Section: Resultsmentioning
confidence: 99%