2016
DOI: 10.1002/pssc.201510171
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Effect of an ITO current spreading layer on the performance of InGaN MQW solar cells

Abstract: InGaN‐based solar cells have been investigated through fabrication with and without using an indium‐tin‐oxide (ITO) current spreading layer (CSL). For the devices with a planar top surface, utilization of the ITO CSL leads to enhanced performance under 1 sun air‐mass 1.5 global spectrum illumination. In contrast, when surface‐texturing is applied to significantly improve the light absorption, the efficiency of the device without using the ITO CSL is higher compared to the one with the ITO. Furthermore, measure… Show more

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Cited by 3 publications
(2 citation statements)
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“…30 Conductive indium tin oxide (ITO) was sputtered at the surface of p-GaN as the current spreading layer, due to its high transparency in the visible spectral region. 31 Finger electrodes (Ni/Au 230 nm) were deposited on the ITO, as shown in Figure 1f4. These designs could effectively decrease contact resistance or parasitic resistance of the structure, which leads to the enhancement of carrier collection and the high fill factor (FF).…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…30 Conductive indium tin oxide (ITO) was sputtered at the surface of p-GaN as the current spreading layer, due to its high transparency in the visible spectral region. 31 Finger electrodes (Ni/Au 230 nm) were deposited on the ITO, as shown in Figure 1f4. These designs could effectively decrease contact resistance or parasitic resistance of the structure, which leads to the enhancement of carrier collection and the high fill factor (FF).…”
Section: Resultsmentioning
confidence: 99%
“…Circular ohmic contacts were made by depositing Ti/Al/Ni/Au with an e-beam and annealing at 850 °C for 30 s in a N 2 atmosphere, which is shown in Figure f3 . Conductive indium tin oxide (ITO) was sputtered at the surface of p-GaN as the current spreading layer, due to its high transparency in the visible spectral region . Finger electrodes (Ni/Au 230 nm) were deposited on the ITO, as shown in Figure f4.…”
Section: Results and Discussionmentioning
confidence: 99%