“…Three main processes which are perturbed by the applied electric field are probably as follows: (1) the recombination process in which the recombination time, consequently the escape probability, depends upon the strength of the electric field and the angle between the direction joining the electron to the positive ion and that of the field; (2) the nonradiative transition process for electrons from a delocalized state to a localized state where the transition is a consequence of an electron-phonon coupling interaction; and (3) a transfer or detrapping process from a localized state to a delocalized state or another localized state by hopping or tunneling. 11 Kato et al 8 showed that the increase in the yield of e80f, e.g., ODe/ODq 1.06 for E = 50 kV cm-1, can be theoretically predicted by assuming that the electric field mainly perturbs process 1. They also comment that whatever the forms of the initial distribution function of thermalized electrons are, the calculated yield of eaof is always larger in the presence of an electric field than in ©…”