“…A similar behavior was reported by Pandey et al [6] and Purohit et al [18] for CdTe and CdSe thin films grown by pulsed laser deposition and thermal evaporation respectively.…”
“…A similar behavior was reported by Pandey et al [6] and Purohit et al [18] for CdTe and CdSe thin films grown by pulsed laser deposition and thermal evaporation respectively.…”
“…The internal strain (ε) in thin films is defined as the disarrangement of lattice created during the deposition process and was calculated by relation concerned [38].…”
Section: X-ray Diffraction Analysismentioning
confidence: 99%
“…It has value n ¼1/2 and 2 for allowed direct and indirect band gap transition respectively. The absorption coefficient (α) was calculated from the relation concerned [38].…”
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