Tensile and low cycle fatigue properties of Sn-3.5Ag-0.5Cu-0.07Ni-0.01Ge (mass%) lead-free solder were investigated using miniature size specimens and obtained data were compared to those of Sn-3.0Ag-0.5Cu (mass%). The microstructure of Sn-3.5Ag-0.5Cu-0.07Ni-0.01Ge consists of dendritic β-Sn phases and ternary eutectic phases surrounding them which are composed of β-Sn, (Cu,Ni)6Sn5 and Ag3Sn. Tensile strength and 0.1% proof stress of Sn-3.5Ag-0.5Cu-0.07Ni-0.01Ge are superior to those of Sn-3.0Ag-0.5Cu at 25°C and 150°C. However, elongation of it is inferior to that of Sn-3.0Ag-0.5Cu at both temperatures. Fatigue lives of both alloys obey the Manson-Coffin equation and are analogous at 25°C. Although fatigue lives of both alloys decrease at 150°C, the fatigue life of Sn-3.5Ag-0.5Cu-0.07Ni-0.01Ge is inferior to that of Sn-3.0Ag-0.5Cu. At 150°C, the crack mainly progresses at grain boundaries of recrystallized grains. Sn-3.5Ag-0.5Cu-0.07Ni-0.01Ge has several grain boundaies which can be the origin of the crack so that fatigue lives degrade at 150°C.