2011
DOI: 10.1016/j.physb.2011.08.009
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Effect of 100MeV Ni9+ ion irradiation on MOCVD grown n-GaN

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Cited by 12 publications
(4 citation statements)
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“…Ga2O3 peaks appearing at 31.11, 52.92, 47.83 and 70.06 can be attributed to interface diffusion at GaN/Al2O3 interface. Similar results about interface diffusion have been previously reported in literature 18,19,20,21,22 .…”
Section: X-ray Diffraction Measurementssupporting
confidence: 91%
See 1 more Smart Citation
“…Ga2O3 peaks appearing at 31.11, 52.92, 47.83 and 70.06 can be attributed to interface diffusion at GaN/Al2O3 interface. Similar results about interface diffusion have been previously reported in literature 18,19,20,21,22 .…”
Section: X-ray Diffraction Measurementssupporting
confidence: 91%
“…Ion irradiation at high energy introduces traps in the deeper levels of the energy bandgap, these defects act as the trapping centers for electrons and holes. This phenomenon results into reduction of the bandgap of the material under study and can be seen as band tailing effects 21 , that we also see in Figure 2.…”
Section: Uv-visible Optical Absorption Spectroscopymentioning
confidence: 59%
“…Gallium nitride (GaN) is a wide bandgap semiconductor material with excellent properties such as wide bandgap (3.39 eV) and high breakdown field (3 MV cm −1 ) [1,2]. With the development of nuclear and space technology, GaN devices will play a role in new high-tech fields such as highenergy nuclear radiation and aerospace vehicles [3].…”
Section: Introductionmentioning
confidence: 99%
“…In order to apply these materials to the space environment, it is necessary to first understand the response of the materials to irradiation. To our knowledge, several experiments have been performed to investigate the behavior of GaN under irradiated environment [34][35][36], but theoretical studies of the nonadiabatic behavior of material in the irradiation environment are also urgently needed. Therefore, it is necessary to understand the dynamic energy deposition process for GaN under ion beam irradiation and the interaction between the moving ion and the GaN target.…”
Section: Introductionmentioning
confidence: 99%