2016
DOI: 10.1016/j.ress.2016.03.012
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Economic allocation of reliability growth testing using Weibull distributions

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Cited by 30 publications
(13 citation statements)
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“…Parameters α j , η j , and φ i describing machine performance state are fitted based on reliability test data or actual historical data, and detailed methods and procedures are available in Vlok et al 29 The values for parameters υ i and θ i in gamma processes are derived by means of maximum likelihood. 30 The value for parameter τ j is obtained by the sum of the products of the proportion of each failure mode and the corresponding repair time based on historical data, and the values for the parameters of the process model are derived based on the response surface method, 31 as displayed in Table 1 and equations (36)–(38)…”
Section: Case Studymentioning
confidence: 99%
“…Parameters α j , η j , and φ i describing machine performance state are fitted based on reliability test data or actual historical data, and detailed methods and procedures are available in Vlok et al 29 The values for parameters υ i and θ i in gamma processes are derived by means of maximum likelihood. 30 The value for parameter τ j is obtained by the sum of the products of the proportion of each failure mode and the corresponding repair time based on historical data, and the values for the parameters of the process model are derived based on the response surface method, 31 as displayed in Table 1 and equations (36)–(38)…”
Section: Case Studymentioning
confidence: 99%
“…In particular, the Weibull distribution and log-normal distribution are widely used in reliability theoretical analysis. Though this has achieved certain results, they show large error and low precision in the process of product reliability estimation [10][11][12][13][14][15]. The accuracy of reliability models increasingly got the attention of scholars and experts.…”
Section: Mathematical Problems In Engineeringmentioning
confidence: 99%
“…However, research on information integration in RGT is relatively scarce 28 and can be subjective. 29 To tackle the drawback of initial assumptions, Coit 20 and Awad 30 have concerned the limitation of uncertainty in their models of allocating testing times by considering the variability of failure intensity rate estimate. Heydari and Sullivan 31 studied the robust allocation problem of testing resources in reliability growth; the AMSAA/Crow parameters in their model are uncertain but assumed to lie within a budget-restricted uncertainty set.…”
Section: Introductionmentioning
confidence: 99%
“…Heydari et al 34 considered the connection-induced failures and modeled the optimal allocation of component-, subsystem- and system-level testing resources in the reliability growth of a series–parallel system. Awad 30 proposed a new method to allocate RGT time for both the subsystem and system levels in order to minimize system failure intensity under limited cost and time resources. Wilson and Quigley 35 investigated a Bayesian approach to the allocation of reliability tasks during product development, and they have developed a general multi-attribute utility function based on targets for cost, time on test and system reliability.…”
Section: Introductionmentioning
confidence: 99%