ECC Caching Techniques for Protecting NAND Flash Memories

Lu, Shyue-Kung; Tsai, Zeng-Long; Hsu, Chun-Lung; Sun, Chi-Tien

doi:10.1109/itc-asia51099.2020.00020

2020 IEEE International Test Conference in Asia (ITC-Asia) 2020

DOI: 10.1109/itc-asia51099.2020.00020

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ECC Caching Techniques for Protecting NAND Flash Memories

Shyue-Kung Lu

Zeng-Long Tsai

Chun-Lung Hsu

et al.

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ECC Caching Techniques for Protecting NAND Flash Memories

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References 16 publications

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