2021 IEEE 48th Photovoltaic Specialists Conference (PVSC) 2021
DOI: 10.1109/pvsc43889.2021.9518482
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Early Detection of Potential Induced Degradation in the Field: Testing a New Method for Silicon PV Modules

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“…Additionally to the above-mentioned problems, Potential-Induced Degradation (PID), Light-Induced Degradation (LID), and general degradation are indeed crucial concerns in the realm of PV technology, especially with the advent of modern advancements like the half-cut Passivated Emitter Rear Cell (PERC) [87,88] or Top Contact (TopCon cells) [89,90]. It may take a long time to detect the PID through traditional data analysis methods, resulting in an undetected energy loss [91]. LID, on the other hand, involves a temporary decrease in efficiency upon initial exposure to light, which stabilizes over time but can still impact long-term performance [92].…”
Section: Typical Maintenance Issuesmentioning
confidence: 99%
“…Additionally to the above-mentioned problems, Potential-Induced Degradation (PID), Light-Induced Degradation (LID), and general degradation are indeed crucial concerns in the realm of PV technology, especially with the advent of modern advancements like the half-cut Passivated Emitter Rear Cell (PERC) [87,88] or Top Contact (TopCon cells) [89,90]. It may take a long time to detect the PID through traditional data analysis methods, resulting in an undetected energy loss [91]. LID, on the other hand, involves a temporary decrease in efficiency upon initial exposure to light, which stabilizes over time but can still impact long-term performance [92].…”
Section: Typical Maintenance Issuesmentioning
confidence: 99%