2011
DOI: 10.1364/jot.78.000558
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Dynamics of the permittivity of a semiconductor acted on by a femtosecond laser

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Cited by 6 publications
(10 citation statements)
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“…Figure 4 shows the dependences of the concentrations of electrons and holes, as well as the electric field strength, on the distance to the surface at the moment of time corresponding to the trailing edge of the pulse (t = t′ + t 0 ) with energy density Q 0 = 0.5 J cm −2 (t p = 100 fs), which is higher than the silicon damage threshold. At such fluence, according to [46] (for λ ~ 800 nm), large-scale periodic structures oriented parallel to the electric field vector of the femtosecond pulse begin to form, which, according to the hypothesis of the authors of [18][19][20][21], is related to the formation of a waveguide structure by depletion of electrons in the surface layer of the semiconductor. As can be seen from the figure, the size of the layer in which the excess positive charge is mainly localized, l + , does not exceed 3-4 nm.…”
Section: Distribution Of Carriers and Quasistationary Electric Field ...mentioning
confidence: 99%
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“…Figure 4 shows the dependences of the concentrations of electrons and holes, as well as the electric field strength, on the distance to the surface at the moment of time corresponding to the trailing edge of the pulse (t = t′ + t 0 ) with energy density Q 0 = 0.5 J cm −2 (t p = 100 fs), which is higher than the silicon damage threshold. At such fluence, according to [46] (for λ ~ 800 nm), large-scale periodic structures oriented parallel to the electric field vector of the femtosecond pulse begin to form, which, according to the hypothesis of the authors of [18][19][20][21], is related to the formation of a waveguide structure by depletion of electrons in the surface layer of the semiconductor. As can be seen from the figure, the size of the layer in which the excess positive charge is mainly localized, l + , does not exceed 3-4 nm.…”
Section: Distribution Of Carriers and Quasistationary Electric Field ...mentioning
confidence: 99%
“…The second effect associated with electron emission has been less widely discussed in the scientific literature, but also deserves close attention. Shandybina et al [18][19][20][21] put forward the hypothesis that strong electron emission may be responsible for the formation of surface periodic structures on silicon oriented parallel to the radiation polarization vector. The idea is as follows.…”
Section: Introductionmentioning
confidence: 99%
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“…Evaluations were performed with the diffusion, emission flows, temporal pulse shape of the dome taking into account for three models of semiconductor photo-excitation: models of two-photon excitation [11][12] ( fig. 4), the model of single-photon excitation, (Fig.…”
Section: Numerical Modellingmentioning
confidence: 99%
“…It is shown in Ref. 4 that emission processes play an important role in the formation of periodic structures on the surface of a semiconductor when it is irradiated with powerful femtosecond pulses. Instantaneous thermalization of the nonequilibrium electrons was assumed when emission was taken into account, and this also requires additional verification.…”
Section: Introductionmentioning
confidence: 99%