2012
DOI: 10.1134/s1063776112090026
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Dynamics of charge carriers at the place of the formation of a muonic atom in diamond and silicon

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Cited by 5 publications
(7 citation statements)
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“…The obtained value confirms the validity of the assumption on the kinetics of a charged radiation defect ( µ B) + thermalization reported in [24]. The hybridization rate (53) is two orders of magnitude less than the rate of a non-hybridized charged center formation.…”
Section: Formation Of Neutral Center ( µ B C 4 ) 0 In Diamondsupporting
confidence: 76%
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“…The obtained value confirms the validity of the assumption on the kinetics of a charged radiation defect ( µ B) + thermalization reported in [24]. The hybridization rate (53) is two orders of magnitude less than the rate of a non-hybridized charged center formation.…”
Section: Formation Of Neutral Center ( µ B C 4 ) 0 In Diamondsupporting
confidence: 76%
“…This process takes short a time, t ∼ 10 −14 s. After the ionization, free electrons lose their energy; for a while, it will be of the order of the forbidden gap energy. This is a diffusion process, when ionized impurities and host atoms are neutralized, and it takes respectively a long time t ≤ 10 −10 s. All of these findings were obtained as a result of a numerical modeling of a neutralization process of muonic atoms in a kinetic approximation for diamond and silicon crystals with different concentrations of impurities [24].…”
Section: Interaction With the Tracementioning
confidence: 65%
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“…To confirm the suggestion on a fast neutralization of a radiation defect, calculations of electron capture by a charged radiation defect, formed by a negative muon in silicon and diamond crystals [21,22], were performed. The calculations in [22] have shown that the kinetics of electron capture by a positively charged radiation defect in silicon and diamond is essentially different.…”
Section: States Of the ( μ B) + Center In A Latticementioning
confidence: 92%
“…The calculations in [22] have shown that the kinetics of electron capture by a positively charged radiation defect in silicon and diamond is essentially different. In silicon, a radiation defect is capturing the necessary number of electrons for a short time period t b 10 −10 s for neutralization, which confirms the qualitative estimates.…”
Section: States Of the ( μ B) + Center In A Latticementioning
confidence: 98%