2001
DOI: 10.1103/physrevlett.87.053001
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Dynamics and Post-Collision Interaction Effects in Two Electron Decay from the Xenon4dHole

Abstract: Two Auger electrons, one very slow, one fast, have been detected in coincidence following near threshold 4d photoionization of the Xe atom. The distribution in the energy the two electrons share has been measured for the first time revealing the presence of post-collision interaction effects that provide unique information on the decay dynamics of the 4d hole. Analysis of the distorted line shapes indicates that the dominant process is decay of Xe+(4d(-1)) to Xe3+ through cascade emission of a zero kinetic ene… Show more

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Cited by 40 publications
(31 citation statements)
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References 21 publications
(27 reference statements)
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“…The laser photon energy is high enough to photoionize Xe 4d core electrons (thresholds: 69.54 and 67.55 eV for spin-orbit states j =3/2 and 5/2, respectively 24 ). The cross section at 90 eV is as large as 22 Mb due to a giant resonance, while for outer shell it is only 1.5 Mb.…”
Section: A Generation Of Electrons By a Bright X-ray Sourcementioning
confidence: 99%
“…The laser photon energy is high enough to photoionize Xe 4d core electrons (thresholds: 69.54 and 67.55 eV for spin-orbit states j =3/2 and 5/2, respectively 24 ). The cross section at 90 eV is as large as 22 Mb due to a giant resonance, while for outer shell it is only 1.5 Mb.…”
Section: A Generation Of Electrons By a Bright X-ray Sourcementioning
confidence: 99%
“…In the case of inner-shell photoionization followed by DA decay, PCI implies the interaction of the emitted photoelectron with the two subsequent Auger electrons and with the field of the ion, which varies during the Auger decay. Previously, PCI effects in DA processes have been investigated experimentally by means of threshold photoelectron yields measured in the vicinity of inner-shell vacancies: Kr 1s −1 , Kr 2p −1 , Kr 3p −1 , Ar 1s −1 , Ar 2p −1 , Xe 4p −1 , and Xe 4d −1 [9][10][11][12][13][14][15][16][17][18]. Also an investigation of PCI-distorted photoelectron lines associated with DA decay and measured in coincidence with the two ejected Auger electrons has been carried out more recently for the case of Ar 2p photoionization [19].…”
Section: Introductionmentioning
confidence: 99%
“…In order to overcome the difficulty of discriminating this continuum from other sources, particularly from background electrons, coincidence studies are required. Ion-electron coincidence measurements initiated by Krause et al [5] were performed in several laboratories [6 -8] as a necessary step in order to corroborate the findings of Carlson and Krause and to further investigate the role of the double Auger decay in Auger cascades [9]. Only measurements detecting the two electrons in coincidence could identify whether the direct double Auger process is indeed the dominant decay mechanism leading to triply ionized final states.…”
mentioning
confidence: 99%