2017
DOI: 10.1103/physrevb.95.214304
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Dynamic strain-induced giant electroresistance and erasing effect in ultrathin ferroelectric tunnel-junction memory

Abstract: Strain engineering plays a critical role in ferroelectric memories. In this work, we demonstrate dynamic strain modulation on tunneling electroresistance in a four-unit-cell ultrathin BaTiO 3 metal/ferroelectric/semiconductor tunnel junction by applying mechanical stress to the device. With an extra compressive strain induced by mechanical stress, which is dynamically applied beyond the lattice mismatch between the BaTiO 3 layer and the Nb : SrTiO 3 substrate, the ON/OFF current ratio increases significantly u… Show more

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Cited by 19 publications
(11 citation statements)
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References 45 publications
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“…Recently, the ferroelectric-driven resistance switching has been proved experimentally in the Pt/BTO/NbSTO tunnel junctions by studying the junction transport as functions of temperature and strain, in which the resistive memory effect decreases and tends to vanish with decreasing polarization of the BTO barrier. 42,43 ■ ASSOCIATED CONTENT * S Supporting Information…”
Section: Discussionmentioning
confidence: 99%
“…Recently, the ferroelectric-driven resistance switching has been proved experimentally in the Pt/BTO/NbSTO tunnel junctions by studying the junction transport as functions of temperature and strain, in which the resistive memory effect decreases and tends to vanish with decreasing polarization of the BTO barrier. 42,43 ■ ASSOCIATED CONTENT * S Supporting Information…”
Section: Discussionmentioning
confidence: 99%
“…Nanoscale ferroelectric systems are a realm of fascination in condensed-matter physics and material community (Yang et al., 2017, Duan et al., 2006). Ferroelectric tunnel junction (FTJ), an ultrathin ferroelectric layer sandwiched by two metallic electrodes (Qin et al., 2016, Li et al., 2015, Pantel et al., 2012), attracts extensive interests as one of the promising ways to achieve semiconductor memories for its advantages of non-destructive readout (Garcia and Bibes, 2014, Scott, 2007, Li et al., 2017a, Garcia et al., 2009), high switching speed (Garcia and Bibes, 2014, Chanthbouala et al., 2012, Yoon et al., 2017), high endurance (Boyn et al., 2017), and simple structure (Guo et al., 2017, Yau et al., 2017). The basic concept of FTJs (called a polar switch at that time) was first proposed by Esaki et al.…”
Section: Introductionmentioning
confidence: 99%
“…It is very interesting that γ-GeSe does or does not have the spontaneous polarization depending on the stacking method of quadruple layers although each constituent quadruple layer does not have any polarization if it is isolated. This feature can bring in advantages for devices with ferroelectric/nonferroelectric junctions [54][55][56][57][58].…”
Section: Resultsmentioning
confidence: 99%