Dynamic responses of normal and partially failed piezoelectric stack actuators under sinusoidal voltages with DC biasing

Abstract

Piezoelectric (PZT) stack actuators are widely used in many fields due to the advantages such as small stroke and high force output. However, failures of one or more PZT layers may exist in PZT stacks and then have influences on their performances. This paper investigates dynamic responses of normal and partially failed PZT stack actuators, in order to evaluate the influences of a failed layer at different positions and furthermore explore the rules, which is of great significance for understanding and improving the performances of partially failed PZT stack actuators. Firstly, a group of experiments were performed and responses of PZT stacks were obtained under sinusoidal voltages with DC biasing. Then a multiple degree-of-freedom (DOF) spring-mass system was built as a theoretical model which was verified by the experimental results to simulate output responses of PZT stack actuators. Based on that, the influences of a failed PZT layer at different positions in the stack were obtained by solving the model under various conditions. The results reveal that the farther the failed PZT layer is from the fixed end, the more significant the influences on the displacement or force output of the PZT stack are. Moreover, the rules of influences of a failed PZT layer at different positions were expressed as a general formula which can be used to better understand, evaluate or identify health conditions of PZT stack actuators.