Dynamic conductivity of nanogranulated films “metal-dielectric” on the microwave frequencies

Influence of layers orientation of graphene stacks in shungite disordered carbon to its integral electrical conductivity

“…The high screening ability of shungite is conditioned by its electrical conductivity, the main role in the formation of which is played carbon, grouped in the form of finite spatial regions separated by interlayers of quartz [4][5][6][7][8]. An important tool to study the shungite structure at the micro level is resistive microscopy, which allows obtaining conductivity maps that reflect the mutual spatial distribution of carbon and quartz and, based on the analysis of such maps, determine the integral conductivity of the sample as a whole [8][9][10][11][12].…”

“…The carbon formations observed by this method consist of "multi-storey" graphene bundles, within which the orientation of the graphene layers has a clearly pronounced predominant direction. The conductivity of the packs is anisotropic [9][10][11].…”

Anticlassical approximation in the problem of electromagnetiv wave reflection from an inhomogeneous medium

“…The conditions of such transformations define broad classes of continuous distributions of the permittivity profile that allow for exact analytical expressions of components of the electromagnetic field. Either numerical or approximate analytical methods [4][5][6][7][8][9][10] are used for a medium with an arbitrary coordinate dependence of material parameters. The quasiclassical approximation, which is also known as the WKB (Wentzel−Kramers−Brillouin) method, is efficient if the refraction index varies slowly over the distance of a wavelength.…”

Исследование Поглощения СВЧ Излучения В Сверхтонких Проводящих Пленках

“…При исследовании и анализе оптических коэффициентов нанометровых пленок в [5] используют понятия характеристических сопротивлений, аппарат длинных линий, что не учитывает возможность преобразования плоской волны в другие типы волн, пространственную и омическую неоднородность пленок -реальные физические характеристики подложек и пленок. В различной степени результаты исследований дифракционных свойств МДС содержатся в работах [6][7][8][9][10][11][12]. Для исследования свойств нанометровых проводящих пленок в радиодиапазоне в настоящей работе предлагается использовать метод связанных волн (RCWA) [13,14], как наиболее приемлемый численный метод, в котором учитываются особенности МДС.…”