Dynamic-Adaptive Field Induced Charged Device Model (FICDM) compact tester model

Weyl, Thorsten; Clarke, Dave; Rinne, K.

doi:10.1109/icsict.2008.4734570

2008 9th International Conference on Solid-State and Integrated-Circuit Technology 2008

DOI: 10.1109/icsict.2008.4734570

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Dynamic-Adaptive Field Induced Charged Device Model (FICDM) compact tester model

Thorsten Weyl

Dave Clarke

K. Rinne

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2009

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Dynamic-Adaptive Field Induced Charged Device Model (FICDM) compact tester model

Cited by 1 publication

References 10 publications

ESD event simulation automation using automatic extraction of the relevant portion of a full chip

ESD event simulation automation using automatic extraction of the relevant portion of a full chip

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