2017
DOI: 10.1021/acs.nanolett.7b00503
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Dual-Scattering Near-Field Microscope for Correlative Nanoimaging of SERS and Electromagnetic Hotspots

Abstract: Surface-enhanced Raman spectroscopy (SERS) enables sensitive chemical studies and materials identification, relying on electromagnetic (EM) and chemical-enhancement mechanisms. Here we introduce a tool for the correlative nanoimaging of EM and SERS hotspots, areas of strongly enhanced EM fields and Raman scattering, respectively. To that end, we implemented a grating spectrometer into a scattering-type scanning near-field optical microscope (s-SNOM) for mapping of both the elastically and inelastically (Raman)… Show more

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Cited by 52 publications
(63 citation statements)
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“…Nanoscale mapping of the SERS intensity of the plasmonic dimers using a dual Raman-Rayleigh scattering scanning near-eld optical microscope shows that the SERS enhancement vanishes on top of the nanodiscs. 47 The presence of chemical enhancement at 638 nm should still lead to a strong and detectable 6T signal, which is clearly not the case in the measurements of Fig. 9.…”
Section: Chemical Enhancementmentioning
confidence: 69%
“…Nanoscale mapping of the SERS intensity of the plasmonic dimers using a dual Raman-Rayleigh scattering scanning near-eld optical microscope shows that the SERS enhancement vanishes on top of the nanodiscs. 47 The presence of chemical enhancement at 638 nm should still lead to a strong and detectable 6T signal, which is clearly not the case in the measurements of Fig. 9.…”
Section: Chemical Enhancementmentioning
confidence: 69%
“…The typical laser spot sizes in a Raman experiment are several hundred nanometers in diameter. Some of us recently introduced a SNOM for inelastically scattered light that measured a SERS hot spot 75 nm in diameter (lateral size perpendicular to the dimer axis) for gold dimers similar to those studied here [18]. As an alternative approach, we obtain an upper limit for the SERS hot spot by spatially mapping the Raman response of graphene on the dimer in real space.…”
Section: B Localization Of the Near-field Enhancementmentioning
confidence: 85%
“…Common techniques to characterize the spatial distribution of the local near-field of a SERS hot spot are electron energy loss spectroscopy [15], scattering optical near-field microscopy (SNOM), and dual s-SNOM for uncovered particles [16][17][18]. The far-field resonance, in contrast, is often investigated by dark-field spectroscopy measuring the elastically scattered light [19].…”
Section: Introductionmentioning
confidence: 99%
“…hot spots 1-10 nm) 16 , the methods are strictly separated into near and far-eld optical methods. Near-eld optical tip-based methods like s-SNOM-SERS 17 and functionalised TERS 18,19 or electron microscopy-based methods like PEEM 19 and STEM/EELS 20 as well as super resolution-imaging 16,21 enable nanoscale mapping of localised surface plasmon resonances (LSPRs) 20 , the electromagnetic eld enhancement [17][18][19] or of individual Raman bands 16,17,21 in hot spots and are important tools in fundamental research to study structural-functional relationships. Due to the high equipment expense, di cult handling and a low versatility these methods are however not common in applied analytical SERS research.…”
Section: Introductionmentioning
confidence: 99%