2013
DOI: 10.1016/j.optcom.2013.01.013
|View full text |Cite
|
Sign up to set email alerts
|

Dual-frequency fringe Fourier transform profilometry based on defocusing

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
1
1

Citation Types

0
9
0

Year Published

2014
2014
2018
2018

Publication Types

Select...
7

Relationship

1
6

Authors

Journals

citations
Cited by 15 publications
(9 citation statements)
references
References 20 publications
0
9
0
Order By: Relevance
“…This, together with the fact the strength of these peaks decreases roughly as 1/|k mn |, limits the aliasing artifacts discussed in the previous section. The strength of the secondary peaks can be further reduced by slightly defocussing the pattern, which effectively acts as an optical low-pass filter [27,28,29].…”
Section: Methodsmentioning
confidence: 99%
“…This, together with the fact the strength of these peaks decreases roughly as 1/|k mn |, limits the aliasing artifacts discussed in the previous section. The strength of the secondary peaks can be further reduced by slightly defocussing the pattern, which effectively acts as an optical low-pass filter [27,28,29].…”
Section: Methodsmentioning
confidence: 99%
“…The effect is same to Eqs. (6)(7)(8)(9)(10)(11). Calculating partial derivatives in fringe domain is replaced with a simple procedure in Fourier spectrum space.…”
Section: Theorymentioning
confidence: 99%
“…Canabal [6] employed a temporal phase unwrapping (TPU) method to adjust the sensibility of the measurement and obtain more accurate results. Fu [7] used a defocusing method to generate dual-frequency fringe to improve the accuracy. Wang [8] combined the optimal pulse width modulation (OPWM) method with the error-diffusion dithering method using the binary defocusing technique to achieve superfast absolute shape measurement.…”
Section: Introductionmentioning
confidence: 99%
“…A vital step in FPP is calibration, which determines the relationship between the unwrapped phase and the height of the object [16][17][18][19]. The main methods utilized to measure complex surfaces are Gray code plus phase-shifting method [20], dual-frequency FPP [21], multi-frequency FPP [22], and so on [23]. Zhang presented a twofrequency binary phase-shifting technique to achieve the 3D shape of complex surfaces; however, the measurement accuracy of this method is not sufficiently high [24].…”
Section: Introductionmentioning
confidence: 99%