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2020
DOI: 10.3788/col202018.061101
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Double-spherically bent crystal high-resolution X-ray spectroscopy of spatially extended sources

Abstract: An aberration-free imaging technique was used to design a double-spherically bent crystal spectrometer with high energy and spatial resolutions to ensure that the individual spectral lines are represented as perfectly straight lines on the detector. After obtaining the matched parameters of the two crystals via geometry-based optimization, an alignment method was employed to allow the spacing between the crystals and the detector to be coupled with the source. The working principle of this spectrum-measuring s… Show more

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Cited by 3 publications
(2 citation statements)
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“…The optical properties of a spherical crystal include a large numerical aperture and high spatial and spectral resolution, which have obvious prospects for applications in high-energy X-ray imaging [9,10] . Koch et al [11] obtained the integrated reflectivity of a Ge h15 7 7i bent crystal at the Ru Heα characteristic line (19.7 keV) and evaluated the feasibility of using it in imaging experiments, although they did not conduct imaging experiments themselves.…”
Section: Introductionmentioning
confidence: 99%
“…The optical properties of a spherical crystal include a large numerical aperture and high spatial and spectral resolution, which have obvious prospects for applications in high-energy X-ray imaging [9,10] . Koch et al [11] obtained the integrated reflectivity of a Ge h15 7 7i bent crystal at the Ru Heα characteristic line (19.7 keV) and evaluated the feasibility of using it in imaging experiments, although they did not conduct imaging experiments themselves.…”
Section: Introductionmentioning
confidence: 99%
“…X-ray free electron laser (XFEL) devices have the advantages of bright intensity, high collimation, high brightness, narrow pulse, high polarization, and wide and continuously adjustable energy, which are unmatched by many conventional and laboratory light sources [1][2][3][4]. Brightness is a key indicator of X-ray light sources.…”
Section: Introductionmentioning
confidence: 99%