2013
DOI: 10.12693/aphyspola.123.361
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Double Differential Cross-Section Measurements for Electron Impact Ionization of Helium

Abstract: The single ionizing collision with an incident electron and atom/molecules ends up two kinds of outgoing electrons called scattering and ejected electrons. As a feature of electron impact ionization these two electrons are indistinguishable. Double dierential cross-sections can be obtained by the measurements of energy and angular distributions of one of the two outgoing electrons by a detector. In this perspective, we used He target that is reasonable to expect to understand ionization mechanisms of atomic sy… Show more

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Cited by 2 publications
(2 citation statements)
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“…The apparatus has been used to measure the triple differential cross-sections for the electron-impact double excitation of helium [123,124], for the electron impact ionization of Argon [115] and H 2 [114]. And also the apparatus has the capability to measure differential cross-sections of the ionization of the atoms and molecules with electron impact [125].…”
Section: Experimental Apparatusmentioning
confidence: 99%
“…The apparatus has been used to measure the triple differential cross-sections for the electron-impact double excitation of helium [123,124], for the electron impact ionization of Argon [115] and H 2 [114]. And also the apparatus has the capability to measure differential cross-sections of the ionization of the atoms and molecules with electron impact [125].…”
Section: Experimental Apparatusmentioning
confidence: 99%
“…The electron spectrometer is a crossed-beams type in which the incident electron beam collides orthogonally with the target gas beam and has been used to measure the triple differential crosssections (TDCS) for the electron-impact double excitation of helium [14,15], for the electron impact ionization of argon [16] and H 2 [17,18].The electron spectrometer was initially designed and constructed to measure angular and energy correlations between outgoing electrons. The same apparatus can also collect data on angular distribution of ejected or scattered electrons simply disabling the coincident circuit [19,20]. In this paper, we report DDCSs measured by using electron spectrometer originally developed for coincidence measurements of ejected and scattered electrons.…”
Section: Methodsmentioning
confidence: 99%