Novel Optical Systems Design and Optimization VII 2004
DOI: 10.1117/12.555653
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Double-channel crystal spectrograph for measuring plasma x-ray in the 1.33-2.46-nm region

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“…The second order R(h x ) was derived from the first order data 22 based on the formulas described in Ref. 23. The sharp edge in the curve around 2.4 keV corresponded to the L-shell absorption edge of thallium (Tl) in the TlAP crystal.…”
Section: A Experimental Setupsmentioning
confidence: 99%
“…The second order R(h x ) was derived from the first order data 22 based on the formulas described in Ref. 23. The sharp edge in the curve around 2.4 keV corresponded to the L-shell absorption edge of thallium (Tl) in the TlAP crystal.…”
Section: A Experimental Setupsmentioning
confidence: 99%
“…4and θ = 30 • −60 • , the X-ray wavelength analyzed by the mica crystal is in the range of 0.992 − 1.718 nm. We may relate the Bragg angle θ to the spectral detection angle β for the given elliptical geometry by [11,12] β = θ + cos −1 cos θ e . The bent crystal spectrometer system is mainly composed of the dispersive element, the vacuum configuration, and the spectral detector.…”
mentioning
confidence: 99%