2017
DOI: 10.1016/j.jmmm.2017.01.075
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Doping of Ga in antiferromagnetic semiconductor α-Cr2O3 and its effects on magnetic and electronic properties

Abstract: The samples of Ga doped Cr 2 O 3 oxide have been prepared using chemical co-precipitation route.X-ray diffraction pattern and Raman spectra have confirmed rhombohedral crystal structure with space group R3 C. Magnetic measurement has indicated the dilution of antiferromagnetic (AFM) spin order in Ga doped α-Cr 2 O 3 system oxide, where the AFM transition temperature of bulk α-Cr 2 O 3 oxide at about 320 K has been suppressed and ferrimagnetic behavior is observed from the analysis of the temperature dependence… Show more

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Cited by 20 publications
(10 citation statements)
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“…The polycrystalline samples of Cr 2-x Ga x O 3 (x = 0.55, 0.83) system (CrGaO) were prepared by chemical reaction and subsequent thermal annealing at 800 0 C. The highly Ga doped sample (Cr 1.17 Ga 0.83 O 3 ) has shown higher current in comparison to low Ga content sample (Cr 1.45 Ga 0.55 O 3 ). It is worthy to mention that I-V loop in the α-Cr 2 O 3 sample is negligibly small in comparison to Ga doped α-Cr 2 O 3 sample, as reported within voltage limit ± 30 V [23] and also true for voltage limit ± 200 V (not shown in figure). The results of the I-V curve analysis also suggest the presence of a significant amount of microscopic level defects (oxygen vacancies-positive charge and oxygen ionsnegative charge), which played a crucial role in the observed bipolar resistive switching process.…”
Section: Discussion and Summary Of Resultssupporting
confidence: 51%
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“…The polycrystalline samples of Cr 2-x Ga x O 3 (x = 0.55, 0.83) system (CrGaO) were prepared by chemical reaction and subsequent thermal annealing at 800 0 C. The highly Ga doped sample (Cr 1.17 Ga 0.83 O 3 ) has shown higher current in comparison to low Ga content sample (Cr 1.45 Ga 0.55 O 3 ). It is worthy to mention that I-V loop in the α-Cr 2 O 3 sample is negligibly small in comparison to Ga doped α-Cr 2 O 3 sample, as reported within voltage limit ± 30 V [23] and also true for voltage limit ± 200 V (not shown in figure). The results of the I-V curve analysis also suggest the presence of a significant amount of microscopic level defects (oxygen vacancies-positive charge and oxygen ionsnegative charge), which played a crucial role in the observed bipolar resistive switching process.…”
Section: Discussion and Summary Of Resultssupporting
confidence: 51%
“…Details of the preparation of Ga doped Cr 2 O 3 samples by chemical co-precipitation and structural phase stabilization have been described in earlier work [23]. In the present work, we used the samples with chemical compositions Cr 1.45 Ga 0.55 O 3 and Cr 1.17 Ga 0.83 O 3 .…”
Section: Materials Preparation and Characterizationmentioning
confidence: 99%
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“…On the other hand, a kink (magnetic field independent) appeared at ~ 51 K and 55 K for FeCr2MA10 and FeCr5MA10 samples, respectively. Such low temperature magnetic anomaly is attributed to freezing of a fraction of surface spins in AFM nanoparticles [9,22]. The normalized MZFC(T) curves for FeCr2MA10 sample showed a minor increment by increasing the field up to 2 kOe.…”
Section: Structural Propertiesmentioning
confidence: 93%
“…An additional peak at 665-670 cm -1 in the spectra of Fe 1-x Cr x O 3 samples with respect to the spectrum of α-Fe 2 O 3 [20] and α-Cr 2 O 3 [22] suggest a modified spin-lattice structure. The band (peak) position (within simple harmonic approximation) obeys the equation v = .…”
Section: Structural Propertiesmentioning
confidence: 94%