Domain switching of ferroelectric polymer film using piezoelectric force microscopy

Abstract

We attempted to clarify the domain switching dynamics in a microscale region of the ferroelectric copolymer poly(vinylidene fluoridetrifluoroethylene) using piezoelectric response force microscopy (PFM). Spatial nonuniformity of the electric field occurred in the polarization operation using PFM owing to the application of a voltage to the cantilever tip. From the nonuniformity in the thickness direction, we found that the nucleation of domain switching occurred unless an electric field exceeding the coercive electric field was applied from the front surface to the back surface of the film. From this finding, it is assumed that a region with a switching domain cannot spread in the film face direction unless the region is penetrated in the thickness direction. Also, we found that the nonuniformity in the film face direction affects the configuration of domain switching and that the domain area can be divided into regions where the polarization is switched rapidly, domain walls move slowly, and both these phenomena occur. These phenomena can be applied to not only the polarization reversal process of ferroelectric polymers but also general polarizations using scanning probe microscopy.

Piezoelectric approaches to organic polymeric materials

“…This frequency change is then measured and used to generate an image of the surface, mapping the local piezoelectric properties of the material. 120 Atomic force microscopy (AFM) systems are commonly used, alongside a lock-in amplifier and functional generator, to conduct PFM measurements (Fig. 10), where the latter creates an oscillating voltage, which is applied to the tip, while the former is used to detect the cantilever oscillations.…”

“…While the accuracy of the measurements can be affected by the tip-sample interactions, PFM is typically limited to characterizing the surface of the material, hence providing a rather qualitative analysis of the approach. 120,[122][123][124] Summary Table 2 summarizes the advantages and disadvantages of different piezoelectric measurement techniques, along with the piezoelectric coefficients or figures of merit that each technique can measure.…”

“…The tip begins to interact with the electric field generated by the piezoelectric material as it approaches the sample, causing a change in the vibration frequency. This frequency change is then measured and used to generate an image of the surface, mapping the local piezoelectric properties of the material 120 . Atomic force microscopy (AFM) systems are commonly used, alongside a lock‐in amplifier and functional generator, to conduct PFM measurements (Fig.…”

“…However, this technique requires specialized equipment and expertise, making it more challenging to use compared to other methods. While the accuracy of the measurements can be affected by the tip–sample interactions, PFM is typically limited to characterizing the surface of the material, hence providing a rather qualitative analysis of the approach 120,122–124 …”

Surface charge dependence on load in amorphous stereocomplex poly(lactic acid) electrets processed with microwave heating

“…The observation of microscopic electric properties using PFM has been applied to several inorganic and organic crystal thin films such as BaTiO 3 , 24) BiFeO 3 , [25][26][27] Pb(Zr,Ti)O 3 , 28) P(VDF/TrFE). 29,30) and PP electret. 31) The scan in contact with the surface was performed with a conductive cantilever with a spring constant and resonant frequencies of 0.1 N m −1 and 37 kHz, respectively.…”