Domain formation mechanism of the Si(110) “
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” reconstruction

Lewis, Nathan; Clayburn, Nathan; Brunkow, Evan; Lassailly, Y.; Fujii, Jun; Vobornik, I.; Flavell, Wendy R.; Seddon, Elaine A.

doi:10.1103/physrevb.95.205306

Cited by 9 publications

(10 citation statements)

References 37 publications

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“…1 a. The observation of densely dotted lines along the and directions agrees very well with earlier studies 35 , 37 , 38 . In Fig.…”

Section: Resultssupporting

confidence: 90%

Investigation of single-domain Au silicide nanowires on Si(110) formed for Au coverages in the monolayer regime

Appelfeller

2021

Sci Rep

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The self-organized formation of single domain Au silicide nanowires is observed on Si(110). These nanowires are analysed using scanning tunnelling microscopy (STM) and spectroscopy (STS) as well as photoemission spectroscopy (PES). Core-level PES is utilised to confirm the formation of Au silicide and establish its presence as the top most surface structure, i.e., the nanowires. The growth of the Au silicide nanowires and their dimensions are studied by STM. They form for Au coverages of about 1 monolayer and are characterized by widths of about 2 to 3 nm and heights below 1 nm while reaching lengths exceeding 500 nm when choosing appropriate annealing temperatures. Valence band PES and STS indicate a small but finite density of states at the Fermi level typical for compound metals.

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“…1 a. The observation of densely dotted lines along the and directions agrees very well with earlier studies 35 , 37 , 38 . In Fig.…”

Section: Resultssupporting

confidence: 90%

Investigation of single-domain Au silicide nanowires on Si(110) formed for Au coverages in the monolayer regime

Appelfeller

2021

Sci Rep

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“…However, during the process of sample cleaning, not only zigzag chains extending in the direction but also those extending in the direction were also frequently dominant. Thus, the direction of the 16×2 reconstruction (or the direction in which zig-zag chains extend) was not related to the direction of current during sample heating, which is consistent with previous studies [12,22]. In the step area, two types of typical facets were observed: (17 15 1) and (15 17 1) [12,16] extending in the directions of and , respectively, which are indicated by dashed arrows in Figure 1.…”

Section: Resultssupporting

confidence: 89%

“…Particularly, the Si(110)-(16×2) reconstructed surface is considered to be an ideal 1D template [4,7,9]. Since this reconstructed surface is reported to be two dimensionally chiral, it has been the subject of many investigations, for example, in efforts to control the chirality for reliable production of nanowires and other nanostructures [7,[10][11][12][13].…”

Section: Introductionmentioning

confidence: 99%

Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

Yamamoto

Izumi

Miki

et al. 2020

Beilstein J. Nanotechnol.

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The atomic arrangement of the Si(110)-(16×2) reconstruction was directly observed using noncontact atomic force microscopy (NC-AFM) at 78 K. The pentagonal structure, which is the most important building block of the reconstruction, was concluded to consist of five atoms, while only four or five spots (depending on tip bias) have been reported with scanning tunneling microscopy (STM). Single atoms were determined to exist near step edges between upper and lower terraces, which have not been reported using STM. These findings are key evidence for establishing an atomic model of the Si(110)-(16×2) reconstruction, which indeed has a complex structure.

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“…Yamada et al suggested that the electromigration induced the SD formation by comparing the current flow effect of two different orientation of rod-shaped Si(110) wafers [17]. They dominantly observed the SD structure on the wafer whose long side, i.e., the current flow direction, was [11 current did not affect the formation of SD [19], and Lewis et al reported that SD "16 × 2" could be formed on the vicinal surface with aligned monatomic steps running parallel to [11 _ 2] [20]. Since the present rectangular rods aligned almost perpendicular to the current flow direction and steps running parallel to [11 _ 2] are expected along the rectangle rod, the vicinity near the edge must be the reason for the present SD formation instead of the electromigration effect.…”

Section: Discussionmentioning

confidence: 99%

Spatial Analytical Surface Structure Mapping for Three-dimensional Micro-shaped Si by Micro-beam Reflection High-energy Electron Diffraction

Nakatsuka

Imaizumi

Abukawa

et al. 2021

e-J. Surf. Sci. Nanotechnol.

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Spatially arranged surfaces on the micro-rod structure, which was three-dimensionally (3D) architected on a Si(110) substrate have been thoroughly investigated by a system with micro-beam reflection high-energy electron diffraction (μ-RHEED) and scanning electron microscopy (SEM). The combination of μ-RHEED and SEM realized analytical structure investigation of 3D surfaces with the spatial resolution of sub micrometer for the 3D rectangular shaped rod consisting of a (110) top surface (20 μm wide) and {111} vertical side surfaces (10 μm wide). Exhaustive mapping revealed the peculiar reconstructed surface structures: Si(110) "16 × 2" single domain and {35 47 7} facet surfaces locally appeared on the interconnected edge region on the 3D structure in addition to the "16 × 2" and 7 × 7 super structures on flat top (110) and side {111} surfaces, respectively. The formation mechanism for "16 × 2" single-domain structure near the corner edge of the (110) surfaces and {35 47 7} facets on the corner edges between (110) and {111} surfaces were discussed from the viewpoint of the surface stability on the 3D geometrical shaped Si structure.

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Domain formation mechanism of the Si(110) “ 16×2 ” reconstruction

Cited by 9 publications

References 37 publications

Investigation of single-domain Au silicide nanowires on Si(110) formed for Au coverages in the monolayer regime

Investigation of single-domain Au silicide nanowires on Si(110) formed for Au coverages in the monolayer regime

Direct observation of the Si(110)-(16×2) surface reconstruction by atomic force microscopy

Spatial Analytical Surface Structure Mapping for Three-dimensional Micro-shaped Si by Micro-beam Reflection High-energy Electron Diffraction

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