The
surface structure of semiconductor photocatalysts controls
the efficiency of charge-carrier extraction during photocatalytic
reactions. However, understanding the connection between surface heterogeneity
and the locations where photogenerated charge carriers are preferentially
extracted is challenging. Herein we use single-molecule fluorescence
imaging to map the spatial distribution of active regions and quantify
the activity for both photocatalytic oxidation and reduction reactions
on individual bismuth oxybromide (BiOBr) nanoplates. Through a coordinate-based
colocalization analysis, we quantify the spatial correlation between
the locations where fluorogenic probe molecules are oxidized and reduced
on the surface of individual nanoplates. Surprisingly, we observed
two distinct photochemical behaviors for BiOBr particles prepared
within the same batch, which exhibit either predominantly uncorrelated
activity where electrons and holes are extracted from different sites
or colocalized activity in which oxidation and reduction take place
within the same nanoscale regions. By analyzing the emissive properties
of the fluorogenic probes, we propose that electrons and holes colocalize
at defect-deficient regions, while defects promote the selective extraction
of one carrier type by trapping either electrons or holes. Although
previous work has used defect engineering to enhance the activity
of bismuth oxyhalides and other semiconductor photocatalysts for useful
reductive half-reactions (e.g., CO2 or N2 reduction),
our results show that defect-free regions are needed to promote both
oxidation and reduction in fuel-generating photocatalysts that do
not rely on sacrificial reagents.