Abstract:With shrinking feature sizes detecting small delay faults is getting more and more important. But not all small delay faults are detectable during at-speed test. By overclocking the circuit with several different test frequencies faster-than-at-speed test (FAST) is able to detect these hidden delay faults. If the clock frequency is increased, some outputs of the circuit may not have stabilized yet, and these outputs have to be considered as unknown ([Formula: see text]-values). These [Formula: see text]-values… Show more
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