Distribution of time delay of electrical breakdown in nitrogen

Abstract

Gives the distribution of experimentally obtained values of time delay of electrical breakdown (td). Measurements of td were made on a specially made nitrogen-filled diode at 13.33 mbar pressure. The results show that the distribution form is easily identifiable after about 500 successively measured td values, and that its form may be estimated after about 100 successively measured td values. These distributions were fitted using the least-squares polynomial approximation method. It was found that the best approximation is obtained by the seventh-order polynomial. Laue's distributions for three groups of successively measured td values, in the range of one millisecond to several seconds, have the same form as those previously obtained by Meek and Craggs (1978), where td values were of the order of one microsecond.

Electrical breakdown in low pressure gases

“…Many previous investigations [11,12,[73][74][75] have shown that the Laue distribution is valid for the t d values that are of the order of a microsecond or a millisecond. Our numerous investigations imply that the validity of this distribution can be widen to the t d data up to the order of 100 s [16,43,45,76,77]. The time delay distribution can also be considered by a Laue distribution and by histograms and corresponding probability density function for exponential distribution [27].…”

“…In the following text, the memory curves recorded with the system described above for gas-filled molybdenum glass tubes with the spherical electrodes made of Fe, Cu and Au (the shape of the tube is given in [45]) will be shown. Before the gas was admitted, the tubes were baked out at 350˚C and evacuated to a pressure of 10 −7 mbar in a process similar to that for production of x-ray and other electron tubes.…”

Investigation of the Influence of Overvoltage, Auxiliary Glow Current and Relaxation Time on the Electrical Breakdown Time Delay Distributions in Neon

“…They increase the electron yield Y in main diode gap, leading to the decrease of breakdown time delay mean values t D . For auxiliary glow current values greater than 10 µA, t D becomes approximately constant, which differs from results recorded in nitrogen, where characteristic minimum of t D appears [35,36]. The similar effects can be assigned to resonant light originated in auxiliary glow.…”

“…This is the Poisson random process, and time interval to electron appearance is statistical time delay t S . Thus, the statistical time delay t S is characterized with the exponential distribution f (t S ) = exp(−t/t S )/t S [1,2,7,8,9]. with the distribution parameter t S = 1/(Y P ) [7,8,9] where Y represents ionization rate (yield) and P describes the probability of one electron to cause breakdown [7].…”

Time lag measurement of electrical breakdown of C3F6 gas

“…Th e number of the measurement should be considered to obtain a precise Laue plot. Pejovic [7] showed the profile of prov ability distribution of the breakdown phenomena in nitrogen gas by a hundred experimental data. On the other hand, it was found from our experiment that t he profile of the Laue plot obtained in SF 6 by fifty measurements is the same as that obtained by a hundred measurements.…”